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Ali Gokirmak
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Modeling of thermoelectric effects in phase change memory cells
A Faraclas, G Bakan, F Dirisaglik, NE Williams, A Gokirmak, H Silva
IEEE Transactions on Electron Devices 61 (2), 372-378, 2014
922014
High speed, high temperature electrical characterization of phase change materials: metastable phases, crystallization dynamics, and resistance drift
F Dirisaglik, G Bakan, Z Jurado, S Muneer, M Akbulut, J Rarey, L Sullivan, ...
Nanoscale 7 (40), 16625-16630, 2015
752015
Extracting the temperature distribution on a phase-change memory cell during crystallization
G Bakan, B Gerislioglu, F Dirisaglik, Z Jurado, L Sullivan, A Dana, C Lam, ...
Journal of Applied Physics 120 (16), 2016
702016
Probability amplitude fluctuations in experimental wave chaotic eigenmodes with and without time-reversal symmetry
DH Wu, JSA Bridgewater, A Gokirmak, SM Anlage
Physical review letters 81 (14), 2890, 1998
631998
Modeling of set and reset operations of phase-change memory cells
A Faraclas, N Williams, A Gokirmak, H Silva
IEEE electron device letters 32 (12), 1737-1739, 2011
582011
Scanned perturbation technique for imaging electromagnetic standing wave patterns of microwave cavities
A Gokirmak, DH Wu, JSA Bridgewater, SM Anlage
Review of scientific instruments 69 (9), 3410-3417, 1998
531998
Electrical Resistivity of Liquid Ge2Sb2Te5 Based on Thin-Film and Nanoscale Device Measurements
K Cil, F Dirisaglik, L Adnane, M Wennberg, A King, A Faraclas, ...
Electron Devices, IEEE Transactions on 60 (1), 433-437, 2013
48*2013
Measurement of wave chaotic eigenfunctions in the time-reversal symmetry-breaking crossover regime
SH Chung, A Gokirmak, DH Wu, JSA Bridgewater, E Ott, TM Antonsen, ...
Physical Review Letters 85 (12), 2482, 2000
472000
High-temperature thermoelectric transport at small scales: Thermal generation, transport and recombination of minority carriers
G Bakan, N Khan, H Silva, A Gokirmak
Scientific reports 3 (1), 2724, 2013
442013
Self-heating of silicon microwires: Crystallization and thermoelectric effects
G Bakan, N Khan, A Cywar, K Cil, M Akbulut, A Gokirmak, H Silva
Journal of Materials Research 26 (9), 1061-1071, 2011
422011
High temperature electrical resistivity and Seebeck coefficient of Ge2Sb2Te5 thin films
L Adnane, F Dirisaglik, A Cywar, K Cil, Y Zhu, C Lam, AFM Anwar, ...
Journal of Applied Physics 122 (12), 2017
412017
Nanoscale semiconductor memories: technology and applications
SK Kurinec, K Iniewski
CRC press, 2013
412013
Modeling of phase-change memory: Nucleation, growth, and amorphization dynamics during set and reset: Part II—Discrete grains
Z Woods, J Scoggin, A Cywar, A Gokirmak
IEEE Transactions on Electron Devices 64 (11), 4472-4478, 2017
382017
Modeling of phase-change memory: Nucleation, growth, and amorphization dynamics during set and reset: Part I—Effective media approximation
Z Woods, A Gokirmak
IEEE Transactions on Electron Devices 64 (11), 4466-4471, 2017
332017
Thickness dependence of the amorphous-cubic and cubic-hexagonal phase transition temperatures of GeSbTe thin films on silicon nitride
HK Peng, K Cil, A Gokirmak, G Bakan, Y Zhu, CS Lai, CH Lam, H Silva
Thin Solid Films 520 (7), 2976-2978, 2012
322012
Write, erase and storage times in nanocrystal memories and the role of interface states
JA Wahl, H Silva, A Gokirmak, A Kumar, JJ Welser, S Tiwari
International Electron Devices Meeting 1999. Technical Digest (Cat. No …, 1999
311999
Melting and crystallization of nanocrystalline silicon microwires through rapid self-heating
G Bakan, A Cywar, H Silva, A Gokirmak
Applied Physics Letters 94 (25), 2009
282009
Modeling and impacts of the latent heat of phase change and specific heat for phase change materials
J Scoggin, RS Khan, H Silva, A Gokirmak
Applied Physics Letters 112 (19), 2018
262018
High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating
L Adnane, N Williams, H Silva, A Gokirmak
Review of Scientific Instruments 86 (10), 2015
252015
Nanoscale RingFETs
N Williams, H Silva, A Gokirmak
Electron Device Letters 33 (10), 1339-1341, 2012
222012
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