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Tarek Lutz
Tarek Lutz
Unknown affiliation
Verified email at nmi.de - Homepage
Title
Cited by
Cited by
Year
Nanoscale mapping of electrical resistivity and connectivity in graphene strips and networks
PN Nirmalraj, T Lutz, S Kumar, GS Duesberg, JJ Boland
Nano letters 11 (1), 16-22, 2011
2062011
Large-scale parallel arrays of silicon nanowires via block copolymer directed self-assembly
RA Farrell, NT Kinahan, S Hansel, KO Stuen, N Petkov, MT Shaw, ...
Nanoscale 4 (10), 3228-3236, 2012
682012
Influence of crystal orientation and body doping on trigate transistor performance
E Landgraf, W Rösner, M Städele, L Dreeskornfeld, J Hartwich, ...
Solid-state electronics 50 (1), 38-43, 2006
572006
Gas phase controlled deposition of high quality large-area graphene films
S Kumar, N McEvoy, T Lutz, GP Keeley, V Nicolosi, CP Murray, WJ Blau, ...
Chemical communications 46 (9), 1422-1424, 2010
562010
Transparent ultrathin conducting carbon films
M Schreiber, T Lutz, GP Keeley, S Kumar, M Boese, S Krishnamurthy, ...
Applied surface science 256 (21), 6186-6190, 2010
452010
Fabrication of a sub-10 nm silicon nanowire based ethanol sensor using block copolymer lithography
S Rasappa, D Borah, CC Faulkner, T Lutz, MT Shaw, JD Holmes, ...
Nanotechnology 24 (6), 065503, 2013
412013
Free-Standing, Single-Crystal Cu3Si Nanowires
SJ Jung, T Lutz, AP Bell, EK McCarthy, JJ Boland
Crystal growth & design 12 (6), 3076-3081, 2012
322012
An investigation of the electrical properties of pyrolytic carbon in reduced dimensions: Vias and wires
AP Graham, G Schindler, GS Duesberg, T Lutz, W Weber
Journal of Applied Physics 107 (11), 2010
322010
Surface energy driven agglomeration and growth of single crystal metal wires
SJ Jung, T Lutz, M Boese, JD Holmes, JJ Boland
Nano letters 11 (3), 1294-1299, 2011
272011
Comparative study of calixarene and HSQ resist systems for the fabrication of sub-20 nm MOSFET device demonstrators
J Kretz, L Dreeskornfeld, G Ilicali, T Lutz, W Weber
Microelectronic engineering 78, 479-483, 2005
242005
A study on the initiation processes of white etching cracks (WECs) in AISI 52100 bearing steel
J Spille, J Wranik, S Barteldes, J Mayer, A Schwedt, M Zürcher, T Lutz, ...
Wear 477, 203864, 2021
212021
Multi-level p+ tri-gate SONOS NAND string arrays
C Friederich, M Specht, T Lutz, F Hofmann, L Dreeskornfeld, W Weber, ...
2006 International Electron Devices Meeting, 1-4, 2006
182006
Resolving in situ specific‐contact, current‐crowding, and channel resistivity in nanowire devices: a case study with silver nanowires
MM Koleśnik, S Hansel, T Lutz, N Kinahan, M Boese, V Krstić
Small 7 (20), 2873-2877, 2011
162011
Contact resistivity and suppression of Fermi level pinning in side-contacted germanium nanowires
MM Koleśnik-Gray, T Lutz, G Collins, S Biswas, JD Holmes, V Krstić
Applied Physics Letters 103 (15), 2013
152013
Determination of best focus and optimum dose for variable shaped e-beam systems by applying the isofocal dose method
K Keil, KH Choi, C Hohle, J Kretz, T Lutz, L Bettin, M Boettcher, ...
Microelectronic engineering 85 (5-6), 778-781, 2008
142008
A Study on Decisive Early Stages in White Etching Crack Formation Induced by Lubrication
J Wranik, W Holweger, T Lutz, P Albrecht, B Reichel, L Wang
Lubricants 10 (5), 96, 2022
132022
Planar double gate transistors with asymmetric independent gates
G Ilicali, W Weber, W Rosner, L Dreeskornfeld, J Hartwich, J Kretz, T Lutz, ...
2005 IEEE International SOI Conference Proceedings, 126-127, 2005
122005
Low temperature graphene growth
S Kumar, N McEvoy, T Lutz, G Keeley, N Whiteside, W Blau, GS Duesberg
ECS Transactions 19 (5), 175, 2009
112009
Evaluation of hybrid lithography and mix and match scenarios for electron beam direct write applications
C Hohle, C Arndt, KH Choi, J Kretz, T Lutz, F Thrum, K Keil
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2007
112007
Anisotropic etching induced by surface energy driven agglomeration
S Jung Jung, T Lutz, JJ Boland
Journal of Vacuum Science & Technology A 29 (5), 2011
102011
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Articles 1–20