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Co-authors
- Kong Aik LeeThe Hong Kong Polytechnic University, Hong KongVerified email at ieee.org
- Koichi SHINODATokyo Institute of TechnologyVerified email at cs.titech.ac.jp
- Hitoshi YamamotoNECVerified email at nec.com
- Nobuaki MinematsuThe University of TokyoVerified email at gavo.t.u-tokyo.ac.jp
- Keikichi HiroseUniversity of Tokyo, Prof. EmeritusVerified email at gavo.t.u-tokyo.ac.jp
- Keisuke OGAKIM3, Inc.Verified email at dwango.co.jp
- Marie-Philippe GillÉcole de Technologie SupérieureVerified email at ens.etsmtl.ca
- Najim DehakAssociate Professor at ECE department, Johns Hopkins University.Verified email at jhu.edu
- Diego CastánIBMVerified email at ibm.com
- Jesús VillalbaJohns Hopkins UniversityVerified email at jhu.edu
- Lei SunUniversity of Science and Technology of ChinaVerified email at mail.ustc.edu.cn
- Jun DuAssociate Professor, NERC-SLIP, USTCVerified email at ustc.edu.cn
- Leibny Paola GarciaJohns Hopkins UniversityVerified email at jhu.edu