| Iodine-doped polyvinylalcohol using positron annihilation spectroscopy B Lobo, MR Ranganath, TSGR Chandran, GV Rao, V Ravindrachary, ... Physical Review B 59 (21), 13693, 1999 | 64 | 1999 |
| Variable low energy positron beams for depth resolved defect spectroscopy in thin film structures G Amarendra, B Viswanathan, GV Rao, J Parimala, B Purniah Current Science, 409-417, 1997 | 51 | 1997 |
| Identification of open-volume defects in disordered and amorphized Si: a depth-resolved positron annihilation study G Amarendra, R Rajaraman, GV Rao, KGM Nair, B Viswanathan, ... Physical Review B 63 (22), 224112, 2001 | 37 | 2001 |
| Dental implant system M Verma, N Bhatnagar, A Sood, F Faraz, K Sharma, GV Rao, PS Kumar, ... US Patent 9,833,300, 2017 | 35 | 2017 |
| Study of defects and strain relaxation in heterostructures using photoluminescence, positron annihilation, and x-ray diffraction BM Arora, KS Chandrasekaran, MR Gokhale, G Nair, GV Rao, ... Journal of Applied Physics 87 (12), 8444-8450, 2000 | 19 | 2000 |
| Magnetic properties of RE2Mo2O7 pyrochlores R Ranganathan, G Rangarajan, R Srinivasan, MA Subramanian, ... Journal of low temperature physics 52, 481-496, 1983 | 17 | 1983 |
| Silicide formation in Co/Si system investigated by depth-resolved positron annihilation and X-ray diffraction S Abhaya, GV Rao, S Kalavathi, VS Sastry, G Amarendra Surface science 600 (13), 2762-2765, 2006 | 14 | 2006 |
| Microstructure, ferromagnetic and photoluminescence properties of ITO and Cr doped ITO nanoparticles using solid state reaction SH Babu, S Kaleemulla, NM Rao, GV Rao, C Krishnamoorthi Physica B: Condensed Matter 500, 126-132, 2016 | 9 | 2016 |
| Evidence for excess vacancy defects in the Pd–Si system: positron annihilation, x-ray diffraction and Auger electron spectroscopy study S Abhaya, G Amarendra, GLN Reddy, R Rajaraman, GV Rao, ... Journal of Physics: Condensed Matter 15 (46), L713, 2003 | 9 | 2003 |
| Study of inter-diffusion and defect evolution in thin film Al/Ge bilayers using SIMS and positron beam G Raghavan, GV Rao, G Amarendra, AK Tyagi, B Viswanathan Applied surface science 178 (1-4), 75-82, 2001 | 9 | 2001 |
| Study of argon-irradiation-induced defects and amorphization in silicon using a positron beam, Raman spectroscopy and ion channelling G Amarendra, GV Rao, AK Arora, KGM Nair, TR Ravindran, K Sekar, ... Journal of Physics: Condensed Matter 11 (30), 5875, 1999 | 8 | 1999 |
| Microstructure and Magnetic Properties of Sn1 − x Ni x O2 Thin Films Prepared by Flash Evaporation Technique M Kuppan, S Kaleemulla, N Madhusudhana Rao, C Krishnamoorthi, ... Journal of Superconductivity and Novel Magnetism 30, 981-987, 2017 | 7 | 2017 |
| Evaluation of the onset of failure under mechanical and thermal stresses on luting agent for metal–ceramic and metal crowns by finite element analysis H Agnihotri, N Bhatnagar, GV Rao, V Jain, H Parkash, AK Kar Contemporary Clinical Dentistry 1 (4), 227-233, 2010 | 7 | 2010 |
| Development of high-rate age-momentum correlation system with a variable-energy pulsed positron beam R Suzuki, T Ohdaira, T Mikado, G Venugopal Rao Materials Science Forum 363, 2001 | 7 | 2001 |
| Silicidation in Pd/Si thin film junction—Defect evolution and silicon surface segregation S Abhaya, G Amarendra, GV Rao, R Rajaraman, BK Panigrahi, VS Sastry Materials Science and Engineering: B 142 (2-3), 62-68, 2007 | 6 | 2007 |
| Depth profiling of defects in argon irradiated silicon using positron beam facility at Kalpakkam G Amarendra, G Venugopal Rao, KGM Nair, B Viswanathan Materials Science Forum 255, 1997 | 6 | 1997 |
| STUDIES ON SOME HIGH Tc SUPERCONDUCTORS GVS Rao, UV Varadaraju, KA Thomas, R Vijayashree, R Srinivasan, ... International Journal of Modern Physics B 1 (03n04), 1097-1103, 1987 | 5 | 1987 |
| Helium implanted CuHf as studied by TDPAC and positron lifetime measurements R Govindaraj, GV Rao, KP Gopinathan, B Viswanathan Pramana 52, 219-233, 1999 | 4 | 1999 |
| Ferromagnetic resonance in amorphous Fe20Ni60B20 GV Rao, CS Sunandana, AK Bhatnagar Journal of Physics: Condensed Matter 4 (5), 1373, 1992 | 4 | 1992 |
| Studies on Ge/CeO2 thin film system using positron beam and Raman spectroscopy GV Rao, G Amarendra, B Viswanathan, S Kanakaraju, S Balaji, S Mohan, ... Thin solid films 406 (1-2), 250-254, 2002 | 3 | 2002 |
