A scalable high-frequency noise model for bipolar transistors with application to optimal transistor sizing for low-noise amplifier design SP Voinigescu, MC Maliepaard, JL Showell, GE Babcock, D Marchesan, ... IEEE journal of solid-state circuits 32 (9), 1430-1439, 1997 | 441 | 1997 |
VBIC95, the vertical bipolar inter-company model CC McAndrew, JA Seitchik, DF Bowers, M Dunn, M Foisy, I Getreu, ... IEEE Journal of Solid-State Circuits 31 (10), 1476-1483, 1996 | 347 | 1996 |
Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy JD Cressler, S Monfray, G Freeman, D Friedman, DJ Paul, S Tsujino, ... CRC press, 2018 | 303 | 2018 |
SiGe HBT technology: Future trends and TCAD-based roadmap M Schröter, T Rosenbaum, P Chevalier, B Heinemann, SP Voinigescu, ... Proceedings of the IEEE 105 (6), 1068-1086, 2016 | 214 | 2016 |
Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz SHM Jen, CC Enz, DR Pehlke, M Schroter, BJ Sheu IEEE Transactions on Electron Devices 46 (11), 2217-2227, 1999 | 205 | 1999 |
Compact hierarchical bipolar transistor modeling with HICUM M Schröter, A Chakravorty World Scientific, 2010 | 160 | 2010 |
Compact hierarchical bipolar transistor modeling with HICUM M Schroter, A Chakravorty World Scientific, 2010 | 127* | 2010 |
Si/SiGe: C and InP/GaAsSb heterojunction bipolar transistors for THz applications P Chevalier, M Schröter, CR Bolognesi, V d'Alessandro, M Alexandrova, ... Proceedings of the IEEE 105 (6), 1035-1050, 2017 | 119 | 2017 |
Physical and electrical performance limits of high-speed SiGeC HBTs—Part I: Vertical scaling M Schroter, G Wedel, B Heinemann, C Jungemann, J Krause, P Chevalier, ... IEEE Transactions on Electron Devices 58 (11), 3687-3696, 2011 | 107 | 2011 |
Carbon nanotube FET technology for radio-frequency electronics: State-of-the-art overview M Schroter, M Claus, P Sakalas, M Haferlach, D Wang IEEE Journal of the Electron Devices Society 1 (1), 9-20, 2013 | 105 | 2013 |
Physics-based minority charge and transit time modeling for bipolar transistors M Schroter, TY Lee IEEE Transactions on electron devices 46 (2), 288-300, 1999 | 92 | 1999 |
A compact physical large-signal model for high-speed bipolar transistors at high current densities—Part II: Two-dimensional model and experimental results HM Rein, M Schroter IEEE transactions on electron devices 34 (8), 1752-1761, 1987 | 90 | 1987 |
High-frequency application of MOS compact models and their development for scalable RF model libraries DR Pehlke, M Schroter, A Burstein, M Matloubian, MF Chang Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No …, 1998 | 83 | 1998 |
Physics-and process-based bipolar transistor modeling for integrated circuit design M Schroter, HM Rein, W Rabe, R Reimann, HJ Wassener, A Koldehoff IEEE Journal of Solid-State Circuits 34 (8), 1136-1149, 1999 | 77 | 1999 |
On the origin of noise in polysilicon emitter bipolar transistors MJ Deen, SL Rumyantsev, M Schroter Journal of Applied Physics 85 (2), 1192-1195, 1999 | 76 | 1999 |
A generalized integral charge-control relation and its application to compact models for silicon-based HBT's M Schroter, M Friedrich, HM Rein IEEE Transactions on electron devices 40 (11), 2036-2046, 1993 | 71 | 1993 |
Towards an optimal contact metal for CNTFETs A Fediai, DA Ryndyk, G Seifert, S Mothes, M Claus, M Schröter, ... Nanoscale 8 (19), 10240-10251, 2016 | 68 | 2016 |
Toward linearity in Schottky barrier CNTFETs S Mothes, M Claus, M Schröter IEEE Transactions on Nanotechnology 14 (2), 372-378, 2015 | 67 | 2015 |
Simulation and modeling of the low-frequency base resistance of bipolar transistors and its dependence on current and geometry M Schroter IEEE transactions on electron devices 38 (3), 538-544, 1991 | 67 | 1991 |
Experimental determination of the internal base sheet resistance of bipolar transistors under forward-bias conditions HM Rein, M Schröter Solid-state electronics 34 (3), 301-308, 1991 | 61 | 1991 |