Model for the linear electro-optic reflectance-difference spectrum of GaAs (001) around E 1 and E 1+ Δ 1 A Lastras-Martínez, RE Balderas-Navarro, LF Lastras-Martínez, MA Vidal Physical Review B 59 (15), 10234, 1999 | 70 | 1999 |
Enhanced optical sensitivity to adsorption due to depolarization of anisotropic surface states LD Sun, M Hohage, P Zeppenfeld, RE Balderas-Navarro, K Hingerl Physical review letters 90 (10), 106104, 2003 | 55 | 2003 |
Surface-induced d-band anisotropy on Cu (110) LD Sun, M Hohage, P Zeppenfeld, RE Balderas-Navarro, K Hingerl Surface Science 527 (1-3), L184-L190, 2003 | 47 | 2003 |
On the origin of resonance features in reflectance difference data of silicon K Hingerl, RE Balderas-Navarro, A Bonanni, P Tichopadek, WG Schmidt Applied surface science 175, 769-776, 2001 | 39 | 2001 |
Origin and temperature dependence of the surface optical anisotropy on Cu (1 1 0) LD Sun, M Hohage, P Zeppenfeld, RE Balderas-Navarro Surface science 589 (1-3), 153-163, 2005 | 36 | 2005 |
Surface-stress-induced optical bulk anisotropy K Hingerl, RE Balderas-Navarro, W Hilber, A Bonanni, D Stifter Physical Review B 62 (19), 13048, 2000 | 35 | 2000 |
A spectrometer for the measurement of reflectance‐difference spectra LF Lastras‐Martínez, A Lastras‐Martínez, RE Balderas‐Navarro Review of scientific instruments 64 (8), 2147-2152, 1993 | 34 | 1993 |
Stress-induced optical anisotropies measured by modulated reflectance LF Lastras-Martínez, RE Balderas-Navarro, A Lastras-Martínez, K Hingerl Semiconductor science and technology 19 (9), R35, 2004 | 29 | 2004 |
Effect of reconstruction-induced strain on the reflectance difference spectroscopy of GaAs (001) around E 1 and E 1+ Δ 1 transitions LF Lastras-Martínez, JM Flores-Camacho, RE Balderas-Navarro, ... Physical Review B 75 (23), 235315, 2007 | 23 | 2007 |
In situ observation of stress relaxation in CdTe/ZnTe heterostructures by reflectance-difference spectroscopy RE Balderas-Navarro, K Hingerl, A Bonanni, H Sitter, D Stifter Applied Physics Letters 78 (23), 3615-3617, 2001 | 22 | 2001 |
Photoreflectance spectroscopy of CdTe(001) around and linear electro-optic spectrum A Lastras-Martınez, RE Balderas-Navarro, P Cantú-Alejandro, ... Journal of applied physics 86 (4), 2062-2065, 1999 | 21 | 1999 |
Microreflectance difference spectrometer based on a charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001) LF Lastras-Martínez, R Castro-García, RE Balderas-Navarro, ... Applied Optics 48 (30), 5713-5717, 2009 | 20 | 2009 |
Measurement of the Surface Strain Induced by Reconstructed Surfaces of GaAs (001)<? format?> Using Photoreflectance and Reflectance-Difference Spectroscopies LF Lastras-Martínez, JM Flores-Camacho, A Lastras-Martínez, ... Physical review letters 96 (4), 047402, 2006 | 20 | 2006 |
Reflectance difference spectroscopy of GaAs (001) under a [110] uniaxial stress LF Lastras-Martínez, M Chavira-Rodríguez, RE Balderas-Navarro, ... Physical Review B 70 (3), 035306, 2004 | 20 | 2004 |
Real-time measurement of the average temperature profiles in liquid cooling using digital holographic interferometry C Guerrero-Mendez, TS Anaya, M Araiza-Esquivel, RE Balderas-Navarro, ... Optical Engineering 55 (12), 121730-121730, 2016 | 19 | 2016 |
Strain oscillations probed with light LD Sun, M Hohage, P Zeppenfeld, RE Balderas-Navarro, K Hingerl physical review letters 96 (1), 016105, 2006 | 19 | 2006 |
Photoreflectance-difference spectroscopy of GaAs (001) under [110] uniaxial stress: Linear and quadratic electro-optic components LF Lastras-Martínez, M Chavira-Rodríguez, A Lastras-Martínez, ... Physical Review B 66 (7), 075315, 2002 | 16 | 2002 |
In situ monitoring of the 2D–3D growth-mode transition in In0. 3Ga0. 7As/GaAs (0 0 1) by reflectance-difference spectroscopy CI Medel-Ruiz, A Lastras-Martı́nez, RE Balderas-Navarro, SL Gallardo, ... Applied surface science 221 (1-4), 48-52, 2004 | 14 | 2004 |
A multichannel reflectance anisotropy spectrometer for epitaxial growth monitoring D Ariza-Flores, J Ortega-Gallegos, O Núñez-Olvera, RE Balderas-Navarro, ... Measurement Science and Technology 26 (11), 115901, 2015 | 13 | 2015 |
Linear electro-optic reflectance modulated spectra of GaAs (001) around E1 and E1+ Δ1 A Lastras-Martınez, RE Balderas-Navarro, LF Lastras-Martınez Thin Solid Films 373 (1-2), 207-210, 2000 | 13 | 2000 |