Costas Spanos
Costas Spanos
Professor of Electrical Engineering and Computer Sciences, University of California, Berkeley
Verified email at berkeley.edu
Title
Cited by
Cited by
Year
Fundamentals of semiconductor manufacturing and process control
GS May, CJ Spanos
John Wiley & Sons, 2006
5022006
Modeling within-die spatial correlation effects for process-design co-optimization
P Friedberg, Y Cao, J Cain, R Wang, J Rabaey, C Spanos
Sixth international symposium on quality electronic design (isqed'05), 516-521, 2005
2682005
Maintenance unit for a sensor apparatus
ML Freed, RS Mundt, CJ Spanos
US Patent 7,282,889, 2007
254*2007
Specular spectroscopic scatterometry
X Niu, N Jakatdar, J Bao, CJ Spanos
IEEE Transactions on Semiconductor Manufacturing 14 (2), 97-111, 2001
2072001
Distributed energy consumption control via real-time pricing feedback in smart grid
K Ma, G Hu, CJ Spanos
IEEE Transactions on Control Systems Technology 22 (5), 1907-1914, 2014
1592014
Real-time statistical process control using tool data (semiconductor manufacturing)
CJ Spanos, HF Guo, A Miller, J Levine-Parrill
IEEE Transactions on Semiconductor Manufacturing 5 (4), 308-318, 1992
1471992
Measurement and analysis of variability in 45 nm strained-Si CMOS technology
LT Pang, K Qian, CJ Spanos, B Nikolic
IEEE Journal of Solid-State Circuits 44 (8), 2233-2243, 2009
1422009
Statistical experimental design in plasma etch modeling
GS May, J Huang, CJ Spanos
IEEE Transactions on Semiconductor Manufacturing 4 (2), 83-98, 1991
1331991
Model-based fault detection and identification for switching power converters
J Poon, P Jain, IC Konstantakopoulos, C Spanos, SK Panda, SR Sanders
IEEE Transactions on Power Electronics 32 (2), 1419-1430, 2016
1312016
MOD-DR: Microgrid optimal dispatch with demand response
M Jin, W Feng, P Liu, C Marnay, C Spanos
Applied energy 187, 758-776, 2017
1292017
Semiconductor yield improvement: results and best practices
SP Cunningham, CJ Spanos, K Voros
IEEE Transactions on Semiconductor Manufacturing 8 (2), 103-109, 1995
1251995
Specular spectroscopic scatterometry in DUV lithography
X Niu, NH Jakatdar, J Bao, CJ Spanos, SK Yedur
Metrology, Inspection, and Process Control for Microlithography XIII 3677 …, 1999
1221999
Microgrid to enable optimal distributed energy retail and end-user demand response
M Jin, W Feng, C Marnay, C Spanos
Applied Energy 210, 1321-1335, 2018
1162018
Accurate indoor localization and tracking using mobile phone inertial sensors, WiFi and iBeacon
H Zou, Z Chen, H Jiang, L Xie, C Spanos
2017 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL …, 2017
1142017
Statistical equipment modeling for VLSI manufacturing: An application for LPCVD
KK Lin, CJ Spanos
IEEE transactions on semiconductor manufacturing 3 (4), 216-229, 1990
1031990
WinIPS: WiFi-based non-intrusive indoor positioning system with online radio map construction and adaptation
H Zou, M Jin, H Jiang, L Xie, CJ Spanos
IEEE Transactions on Wireless Communications 16 (12), 8118-8130, 2017
1012017
WinLight: A WiFi-based occupancy-driven lighting control system for smart building
H Zou, Y Zhou, H Jiang, SC Chien, L Xie, CJ Spanos
Energy and Buildings 158, 924-938, 2018
1002018
Gate line edge roughness model for estimation of FinFET performance variability
K Patel, TJK Liu, CJ Spanos
IEEE Transactions on Electron Devices 56 (12), 3055-3063, 2009
1002009
Statistical process control in semiconductor manufacturing
CJ Spanos
Proceedings of the IEEE 80 (6), 819-830, 1992
961992
Methods and apparatus for obtaining data for process operation, optimization, monitoring, and control
ML Freed, RS Mundt, CJ Spanos
US Patent 6,691,068, 2004
872004
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