R F Egerton

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Marek MalacNanotechnology Research Centre, National Research Council and Dept. of Physics, U of AlbertaVerified email at ualberta.ca
Shangcong ChengGuest Scientist, Molecular Foundry of Lawrence Berkeley National LabVerified email at lbl.gov
Feng WangArgonne National LaboratoryVerified email at anl.gov
Marco BeleggiaUniversity of Modena and Reggio EmiliaVerified email at unimore.it
Peter RezProfessor of Physics, Arizona State UniversityVerified email at asu.edu
Frank HegmannProfessor, Department of Physics, University of Alberta, CanadaVerified email at ualberta.ca
M. Sergio MorenoResearch Fellow (Group Leader) in CONICET. Centro Atómico Bariloche - San Carlos de BarilocheVerified email at cab.cnea.gov.ar
Oksana OstroverkhovaProfessor of Physics, Oregon State UniversityVerified email at science.oregonstate.edu
Toshihiro AokiIrvine Materials Research Institute, University of California, IrvineVerified email at uci.edu
Tracy LovejoyScientist, NionVerified email at nion.com
Ondrej KrivanekNion Co., Arizona State U.Verified email at nion.com
Robert A. McLeodLead Software Architect Scientist, Hitachi High-tech Canada Inc.Verified email at hitachi-hightech.com
Mark FreemanDepartment of Physics, University of AlbertaVerified email at ualberta.ca
Philip E BatsonResearch Professor of Physics, Rutgers UniversityVerified email at physics.rutgers.edu
Dong Su（苏东）Institute of Physics, CAS; Past: Brookhaven National Laboratory；Stony Brook Univ.; ASU; EPFLVerified email at iphy.ac.cn
John J. RehrProfessor of Physics, University of WashingtonVerified email at uw.edu
Stephen PennycookUniversity of TennesseeVerified email at utk.edu

R F Egerton

Emeritus Professor, University of Alberta

Verified email at ualberta.ca - Homepage

electron microscopy energy-loss spectroscopy radiation damage


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Electron energy-loss spectroscopy in the electron microscope RF Egerton Springer Science & Business Media, 2011	7401	2011
Radiation damage in the TEM and SEM RF Egerton, P Li, M Malac Micron 35 (6), 399-409, 2004	2401	2004
Physical principles of electron microscopy RF Egerton Springer, 2005	2080	2005
Electron energy-loss spectroscopy in the TEM RF Egerton Reports on Progress in Physics 72 (1), 016502, 2008	1094	2008
EELS log‐ratio technique for specimen‐thickness measurement in the TEM T Malis, SC Cheng, RF Egerton Journal of electron microscopy technique 8 (2), 193-200, 1988	1027	1988
Vibrational spectroscopy in the electron microscope OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ... Nature 514 (7521), 209-212, 2014	788	2014
Energy-filtering transmission electron microscopy C Deininger, RF Egerton, F Hofer, B Jouffrey, D Krahl, RD Leapman, ... Springer, 2013	451	2013
Control of radiation damage in the TEM RF Egerton Ultramicroscopy 127, 100-108, 2013	391	2013
Radiation damage to organic and inorganic specimens in the TEM RF Egerton Micron 119, 72-87, 2019	359	2019
Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV RF Egerton Microscopy research and technique 75 (11), 1550-1556, 2012	323	2012
Basic questions related to electron-induced sputtering in the TEM RF Egerton, R McLeod, F Wang, M Malac Ultramicroscopy 110 (8), 991-997, 2010	294	2010
K-shell ionization cross-sections for use in microanalysis RF Egerton Ultramicroscopy 4 (2), 169-179, 1979	279	1979
Inelastic scattering of 80 keV electrons in amorphous carbon RF Egerton Philosophical Magazine 31 (1), 199-215, 1975	226	1975
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy RF Egerton Ultramicroscopy 107 (8), 575-586, 2007	220	2007
Bandlike transport in pentacene and functionalized pentacene thin films revealed by subpicosecond transient photoconductivity measurements O Ostroverkhova, DG Cooke, S Shcherbyna, RF Egerton, FA Hegmann, ... Physical Review B—Condensed Matter and Materials Physics 71 (3), 035204, 2005	217	2005
Formulae for light-element micro analysis by electron energy-loss spectrometry RF Egerton Ultramicroscopy 3, 243-251, 1978	201	1978
Measurement of local thickness by electron energy-loss spectroscopy RF Egerton, SC Cheng Ultramicroscopy 21 (3), 231-244, 1987	186	1987
Choice of operating voltage for a transmission electron microscope RF Egerton Ultramicroscopy 145, 85-93, 2014	179	2014
Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology O Ostroverkhova, S Shcherbyna, DG Cooke, RF Egerton, FA Hegmann, ... Journal of Applied Physics 98 (3), 2005	168	2005
Fabrication of submicrometer regular arrays of pillars and helices M Malac, RF Egerton, MJ Brett, B Dick Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999	149	1999

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