| Electron energy-loss spectroscopy in the electron microscope RF Egerton Springer Science & Business Media, 2011 | 7094 | 2011 |
| Radiation damage in the TEM and SEM RF Egerton, P Li, M Malac Micron 35 (6), 399-409, 2004 | 2140 | 2004 |
| Physical principles of electron microscopy RF Egerton Springer, 2005 | 1805 | 2005 |
| Electron energy-loss spectroscopy in the TEM RF Egerton Reports on Progress in Physics 72 (1), 016502, 2008 | 1007 | 2008 |
| EELS log‐ratio technique for specimen‐thickness measurement in the TEM T Malis, SC Cheng, RF Egerton Journal of electron microscopy technique 8 (2), 193-200, 1988 | 922 | 1988 |
| Vibrational spectroscopy in the electron microscope OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ... Nature 514 (7521), 209-212, 2014 | 668 | 2014 |
| Energy-filtering transmission electron microscopy C Deininger, RF Egerton, F Hofer, B Jouffrey, D Krahl, RD Leapman, ... Springer, 2013 | 446 | 2013 |
| Control of radiation damage in the TEM RF Egerton Ultramicroscopy 127, 100-108, 2013 | 337 | 2013 |
| K-shell ionization cross-sections for use in microanalysis RF Egerton Ultramicroscopy 4 (2), 169-179, 1979 | 269 | 1979 |
| Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV RF Egerton Microscopy research and technique 75 (11), 1550-1556, 2012 | 268 | 2012 |
| Basic questions related to electron-induced sputtering in the TEM RF Egerton, R McLeod, F Wang, M Malac Ultramicroscopy 110 (8), 991-997, 2010 | 264 | 2010 |
| Radiation damage to organic and inorganic specimens in the TEM RF Egerton Micron 119, 72-87, 2019 | 260 | 2019 |
| Inelastic scattering of 80 keV electrons in amorphous carbon RF Egerton Philosophical Magazine 31 (1), 199-215, 1975 | 229 | 1975 |
| Bandlike transport in pentacene and functionalized pentacene thin films revealed by subpicosecond transient photoconductivity measurements O Ostroverkhova, DG Cooke, S Shcherbyna, RF Egerton, FA Hegmann, ... Physical Review B 71 (3), 035204, 2005 | 213 | 2005 |
| Formulae for light-element micro analysis by electron energy-loss spectrometry RF Egerton Ultramicroscopy 3, 243-251, 1978 | 203 | 1978 |
| Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy RF Egerton Ultramicroscopy 107 (8), 575-586, 2007 | 200 | 2007 |
| Measurement of local thickness by electron energy-loss spectroscopy RF Egerton, SC Cheng Ultramicroscopy 21 (3), 231-244, 1987 | 171 | 1987 |
| Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology O Ostroverkhova, S Shcherbyna, DG Cooke, RF Egerton, FA Hegmann, ... Journal of Applied Physics 98 (3), 033701, 2005 | 164 | 2005 |
| Choice of operating voltage for a transmission electron microscope RF Egerton Ultramicroscopy 145, 85-93, 2014 | 154 | 2014 |
| Electron energy loss spectra of diamond, graphite and amorphous carbon RF Egerton, MJ Whelan Journal of Electron Spectroscopy and Related Phenomena 3 (3), 232-236, 1974 | 149 | 1974 |
Marek MalacNanotechnology Research Centre, National Research Council and Dept. of Physics, U of AlbertaVerified email at ualberta.ca
