A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures K Ganesan, S Ghosh, NG Krishna, S Ilango, M Kamruddin, AK Tyagi Physical Chemistry Chemical Physics 18 (32), 22160-22167, 2016 | 157 | 2016 |
Optical band-gap and associated Urbach energy tails in defected AlN thin films grown by ion beam sputter deposition: Effect of assisted ion energy N Sharma, K Prabakar, S Ilango, S Dash, AK Tyagi Advanced Materials Proceedings 2 (5), 342-346, 2017 | 44 | 2017 |
Flipping growth orientation of nanographitic structures by plasma enhanced chemical vapor deposition S Ghosh, K Ganesan, SR Polaki, S Ilango, S Amirthapandian, S Dhara, ... RSC advances 5 (111), 91922-91931, 2015 | 28 | 2015 |
X-ray photoelectron spectroscopy studies on AlN thin films grown by ion beam sputtering in reactive assistance of N+/N2+ ions: Substrate temperature induced compositional … N Sharma, S Ilango, S Dash, AK Tyagi Thin Solid Films 636, 626-633, 2017 | 23 | 2017 |
The role of structural defects on the transport properties of a few-walled carbon nanotube networks R Kamalakannan, K Ganesan, S Ilango, N Thirumurugan, VN Singh, ... Applied Physics Letters 98 (19), 2011 | 21 | 2011 |
Conductive atomic force microscopy studies on dielectric breakdown behavior of ultrathin Al2O3 films K Ganesan, S Ilango, S Mariyappan, MF Baroughi, M Kamruddin, ... Applied Physics Letters 98 (9), 2011 | 18 | 2011 |
Au induced crystallization and layer exchange in a-Si/Au thin film on glass below and above the eutectic temperature CK Singh, T Tah, KK Madapu, K Saravanan, S Ilango, S Dash Journal of Non-Crystalline Solids 460, 130-135, 2017 | 16 | 2017 |
Crystallization kinetics and role of stress in Al induced layer exchange crystallization process of amorphous SiGe thin film on glass T Sain, CK Singh, S Ilango, T Mathews Journal of Applied Physics 126 (12), 2019 | 14 | 2019 |
Si and N-Vacancy color centers in discrete diamond nanoparticles: Raman and fluorescence spectroscopic studies K Ganesan, PK Ajikumar, S Ilango, G Mangamma, S Dhara Diamond and Related Materials 92, 150-158, 2019 | 13 | 2019 |
In-situ formation of Ge-rich SiGe alloy by electron beam evaporation and the effect of post deposition annealing on the energy band gap T Tah, CK Singh, S Amirthapandian, KK Madapu, A Sagdeo, S Ilango, ... Materials Science in Semiconductor Processing 80, 31-37, 2018 | 13 | 2018 |
On the evolution of residual stress at different substrate temperatures in sputter-deposited polycrystalline Mo thin films by x-ray diffraction CK Singh, S Ilango, SR Polaki, S Dash, AK Tyagi Materials Research Express 1 (3), 036401, 2014 | 13 | 2014 |
Application of dynamic scaling theory for growth kinetic studies of AlN-thin films deposited by ion beam sputtering in reactive assistance of nitrogen plasma N Sharma, K Prabakar, S Ilango, S Dash, AK Tyagi Applied Surface Science 347, 875-879, 2015 | 11 | 2015 |
Charged vacancy induced enhanced piezoelectric response of reactive assistive IBSD grown AlN thin films N Sharma, M Rath, S Ilango, TR Ravindran, MSR Rao, S Dash, AK Tyagi Journal of Physics D: Applied Physics 50 (1), 015601, 2016 | 10 | 2016 |
Optical band gap and associated band-tails in nanocrystalline AlN thin films grown by reactive IBSD at different substrate temperatures N Sharma, S Sharma, K Prabakar, S Amirthapandian, S Ilango, S Dash, ... arXiv preprint arXiv:1507.04867, 2015 | 9 | 2015 |
Pre-and post-breakdown electrical studies in ultrathin Al2O3 films by conductive atomic force microscopy K Ganesan, S Ilango, M Shanmugam, MF Baroughi, M Kamruddin, ... Current applied physics 13 (9), 1865-1869, 2013 | 9 | 2013 |
Surface morphology of annealed titanium/silicon bilayer in the presence of oxygen S Ilango, G Raghavan, M Kamruddin, S Bera, AK Tyagi Applied Physics Letters 87 (10), 2005 | 8 | 2005 |
Shallow nitrogen ion implantation: Evolution of chemical state and defect structure in titanium PA Manojkumar, VA Chirayath, AK Balamurugan, NG Krishna, S Ilango, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2016 | 7 | 2016 |
A very low temperature (170° C) crystallization of amorphous-Ge thin film on glass via Au induced layer exchange process in amorphous-Ge/GeOx/Au/glass stack and electrical … CK Singh, EP Amaladass, PK Parida, T Sain, S Ilango, S Dhara Applied Surface Science 541, 148679, 2021 | 6 | 2021 |
On the role of oxygen in the catalysis of C54 titanium disilicide by Ti5Si3 phase S Ilango, G Raghavan, S Kalavathi, BK Panigrahi, AK Tyagi Journal of applied physics 98 (7), 2005 | 6 | 2005 |
Secondary Ion Mass Spectrometry based depth profiling of Mo/Si interfaces with different microcrystalline structure CK Singh, S Ilango, S Dash, AK Tyagi Materials Chemistry and Physics 173, 475-481, 2016 | 4 | 2016 |