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Co-authors
- Matteo RinaldiDirector, SMART Center and Professor, Electrical and Computer Engineering, Northeastern UniversityVerified email at ece.neu.edu
- Zhenyun QianAssociate Research Professor, Northeastern UniversityVerified email at northeastern.edu
- Nian Xiang SunCOE Distinguished Professor of Electrical and Computer Engineering, Physics, NortheasternVerified email at northeastern.edu
- Tianxiang Nan (南天翔)Institute of Microelectronics, Tsinghua UniversityVerified email at mail.tsinghua.edu.cn
- Fangze Liu 刘方泽Beijing Institute of TechnologyVerified email at bit.edu.cn
- Swastik KarNortheastern UniversityVerified email at northeastern.edu
- J. Sebastián Gómez-DíazProfessor, University of California, DavisVerified email at ucdavis.edu
- Andrea AluCUNY Advanced Science Research CenterVerified email at gc.cuny.edu
- Gianluca PiazzaProfessor of Electrical Engineering, Carnegie Mellon UniversityVerified email at ece.cmu.edu