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KIHYUN CHOI
KIHYUN CHOI
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Title
Cited by
Cited by
Year
Room-temperature triggered single photon emission from a III-nitride site-controlled nanowire quantum dot
MJ Holmes, K Choi, S Kako, M Arita, Y Arakawa
Nano letters 14 (2), 982-986, 2014
4582014
Selective-area growth of thin GaN nanowires by MOCVD
K Choi, M Arita, Y Arakawa
Journal of Crystal Growth 357, 58-61, 2012
1562012
Single photons from a hot solid-state emitter at 350 K
MJ Holmes, S Kako, K Choi, M Arita, Y Arakawa
ACS photonics 3 (4), 543-546, 2016
1012016
Spectral diffusion and its influence on the emission linewidths of site-controlled GaN nanowire quantum dots
M Holmes, S Kako, K Choi, M Arita, Y Arakawa
Physical Review B 92 (11), 115447, 2015
602015
Photoluminescence from highly excited AlN epitaxial layers
Y Yamada, K Choi, S Shin, H Murotani, T Taguchi, N Okada, H Amano
Applied Physics Letters 92 (13), 2008
452008
Strong exciton confinement in site-controlled GaN quantum dots embedded in nanowires
K Choi, S Kako, MJ Holmes, M Arita, Y Arakawa
Applied Physics Letters 103 (17), 2013
392013
Measurement of an Exciton Rabi Rotation in a Single Nanowire-Quantum Dot <?format ?>Using Photoluminescence Spectroscopy: Evidence for …
M Holmes, S Kako, K Choi, P Podemski, M Arita, Y Arakawa
Physical Review Letters 111 (5), 057401, 2013
362013
Site-controlled growth of single GaN quantum dots in nanowires by MOCVD
K Choi, M Arita, S Kako, Y Arakawa
Journal of crystal growth 370, 328-331, 2013
312013
Enhanced reliability of 7-nm process technology featuring EUV
K Choi, HC Sagong, W Kang, H Kim, J Hai, M Lee, B Kim, M Lee, S Lee, ...
IEEE Transactions on Electron Devices 66 (12), 5399-5403, 2019
222019
Modeling of FinFET self-heating effects in multiple FinFET technology generations with implication for transistor and product reliability
HC Sagong, K Choi, J Kim, T Jeong, M Choe, H Shim, W Kim, J Park, ...
2018 IEEE Symposium on VLSI Technology, 121-122, 2018
202018
Reliability on evolutionary FinFET CMOS technology and beyond
K Choi, HC Sagong, M Jin, J Hai, M Lee, T Jeong, MS Yeo, H Shim, ...
2020 IEEE International Electron Devices Meeting (IEDM), 9.3. 1-9.3. 4, 2020
152020
Probing the excitonic states of site-controlled GaN nanowire quantum dots
MJ Holmes, S Kako, K Choi, P Podemski, M Arita, Y Arakawa
Nano Letters 15 (2), 1047-1051, 2015
142015
Linearly polarized single photons from small site-controlled GaN nanowire quantum dots
MJ Holmes, S Kako, K Choi, M Arita, Y Arakawa
Gallium Nitride Materials and Devices XI 9748, 138-142, 2016
102016
Temperature dependent photoluminescence excitation spectroscopy of GaN quantum dots in site controlled GaN/AlGaN nanowires
MJ Holmes, S Kako, K Choi, P Podemski, M Arita, Y Arakawa
Japanese Journal of Applied Physics 52 (8S), 08JL02, 2013
82013
Reverse body bias dependence of HCI reliability in advanced FinFET
MI Mahmud, R Ranjan, KD Lee, PR Perepa, CD Kwon, S Choo, K Choi
2022 IEEE International Reliability Physics Symposium (IRPS), P58-1-P58-4, 2022
62022
Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology
S Kim, U Jung, S Choo, K Choi, T Chung, S Chung, E Lee, J Park, D Bae, ...
2022 IEEE International Reliability Physics Symposium (IRPS), 11A. 1-1-11A. 1-7, 2022
52022
FEOL self-heating and BEOL joule-heating effects of FinFET technology and its implications for reliability prediction
H Jiang, T Jeong, H Sagong, K Choi, M Jin, M Yeo, H Rhee, E Lee
2020 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2020
42020
Time dependent variability in advanced FinFET technology for end-of-lifetime reliability prediction
H Jiang, J Kim, K Choi, H Shim, H Sagong, J Park, H Rhee, E Lee
2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021
32021
Reliability of advanced FinFET technology nodes beyond planar
HC Sagong, K Choi, H Jiang, J Park, H Rhee, S Pae
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-4, 2020
32020
Reliability Characterization on Advanced FinFET Technology
K Choi, T Jeong, J Kim, S Choo, Y Kim, MS Yeo, M Lee, J Kim, E Lee
2021 IEEE International Interconnect Technology Conference (IITC), 1-3, 2021
22021
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