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Seung Soo Kim
Seung Soo Kim
Verified email at snu.ac.kr
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Year
Review of semiconductor flash memory devices for material and process issues
SS Kim, SK Yong, W Kim, S Kang, HW Park, KJ Yoon, DS Sheen, S Lee, ...
Advanced Materials 35 (43), 2200659, 2023
672023
Kernel Application of the Stacked Crossbar Array Composed of Self‐Rectifying Resistive Switching Memory for Convolutional Neural Networks
Y Kim, J Kim, SS Kim, YJ Kwon, GS Kim, JW Jeon, DE Kwon, JH Yoon, ...
Advanced Intelligent Systems 2 (2), 1900116, 2020
132020
Copper bottom-up filling by electroplating without any additives on patterned wafer
SH Cha, SS Kim, SK Cho, JJ Kim
Electrochemical and solid-state letters 10 (2), D22, 2006
112006
Highly parallel stateful Boolean logic gates based on aluminum-doped self-rectifying memristors in a vertical crossbar array structure
T Park, SS Kim, BJ Lee, TW Park, HJ Kim, CS Hwang
Nanoscale 15 (13), 6387-6395, 2023
62023
Influences of oxygen source and substrate temperature on the unusual growth mechanism of atomic layer deposited magnesium oxide using bis (cyclopentadienyl) magnesium precursor
BW Wang, J Choi, HG Kim, SD Hyun, C Yoo, S Kim, H Lee, CS Hwang
Journal of Materials Chemistry C 9 (42), 15359-15374, 2021
62021
Bottom-up filling using electrochemical oxidation on patterned wafers
SH Cha, SS Kim, SK Cho, JJ Kim
Electrochemical and Solid-State Letters 8 (11), C170, 2005
42005
Improving the water-resistance of MgO-based metal–insulator–metal capacitors by inserting a BeO thin film grown via atomic layer deposition
BW Wang, S Kim, H Song, H Seo, X Li, JM Choi, J Choi, J Shin, ...
Journal of Materials Chemistry C 10 (17), 6611-6620, 2022
12022
Heterogeneous reservoir computing in second-order Ta 2 O 5/HfO 2 memristors
N Ghenzi, TW Park, SS Kim, HJ Kim, YH Jang, KS Woo, CS Hwang
Nanoscale Horizons, 2024
2024
Fabrication of a Hole‐Type Vertical Resistive‐Switching Random‐Access Array and Intercell Interference Induced by Lateral Charge Spreading
SS Kim, SK Yong, J Kim, JM Choi, TW Park, HY Kim, HJ Kim, CS Hwang
Advanced Electronic Materials 9 (3), 2200998, 2023
2023
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