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Co-authors
Rui ZhangNational University of SingaporeVerified email at nus.edu.sg
Kaibin HuangProfessor, Dept. of EEE, The University of Hong Kong; IEEE Fellow; ISI Highly Cited ResearcherVerified email at eee.hku.hk
Liang LiuHighly Cited Researcher, EIE Department, The Hong Kong Polytechnic UniversityVerified email at polyu.edu.hk
Yong Zeng (曾勇)Southeast University, China; Purple Mountain Laboratories, ChinaVerified email at e.ntu.edu.sg
Hyojin LeeQualcomm Technologies Inc.Verified email at postech.ac.kr
Lee JuhoSamsung ElectronicsVerified email at samsung.com