| Effect of carrier concentration on optical bandgap shift in ZnO: Ga thin films CE Kim, P Moon, S Kim, JM Myoung, HW Jang, J Bang, I Yun Thin Solid Films 518 (22), 6304-6307, 2010 | 190 | 2010 |
| Analysis of bias stress instability in amorphous InGaZnO thin-film transistors EN Cho, JH Kang, CE Kim, P Moon, I Yun IEEE Transactions on Device and Materials Reliability 11 (1), 112-117, 2010 | 118 | 2010 |
| Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms YD Ko, P Moon, CE Kim, MH Ham, JM Myoung, I Yun Expert Systems with Applications 36 (2), 4061-4066, 2009 | 55 | 2009 |
| Mobility enhancement in amorphous InGaZnO thin-film transistors by Ar plasma treatment JH Kang, E Namkyu Cho, C Eun Kim, MJ Lee, S Jeong Lee, JM Myoung, ... Applied Physics Letters 102 (22), 2013 | 54 | 2013 |
| Density-of-states modeling of solution-processed InGaZnO thin-film transistors CE Kim, EN Cho, P Moon, GH Kim, DL Kim, HJ Kim, I Yun IEEE Electron Device Letters 31 (10), 1131-1133, 2010 | 48 | 2010 |
| Effects of nitrogen doping on device characteristics of InSnO thin film transistor C Eun Kim, I Yun Applied Physics Letters 100 (1), 2012 | 34 | 2012 |
| Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications CE Kim, P Moon, I Yun, S Kim, JM Myoung, HW Jang, J Bang Expert Systems with Applications 38 (3), 2823-2827, 2011 | 34 | 2011 |
| Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm EN Cho, P Moon, CE Kim, I Yun Expert Systems with Applications 39 (10), 8885-8889, 2012 | 27 | 2012 |
| Effects of the interfacial layer on electrical characteristics of Al2O3/TiO2/Al2O3 thin films for gate dielectrics CE Kim, I Yun Applied surface science 258 (7), 3089-3093, 2012 | 27 | 2012 |
| Characterization of Al2O3 films grown by electron beam evaporator on Si substrates MY Seo, EN Cho, CE Kim, P Moon, I Yun 2010 3rd International Nanoelectronics Conference (INEC), 238-239, 2010 | 14 | 2010 |
| Modeling of In2O3-10 wt% ZnO thin film properties for transparent conductive oxide using neural networks CE Kim, HS Shin, P Moon, HJ Kim, I Yun Current Applied Physics 9 (6), 1407-1410, 2009 | 13 | 2009 |
| Device characteristics of Ti–InSnO thin film transistors with modulated double and triple channel structures CE Kim, I Yun Thin Solid Films 537, 275-278, 2013 | 10 | 2013 |
| Jungsik Bang, Ilgu Yun CE Kim, P Moon, S Kim, JM Myoung, HW Jang Thin Solid Films 518 (22), 6304, 2010 | 10 | 2010 |
| Material characterization and process modeling issues of high-k dielectrics for FET applications JH Kang, CE Kim, MS Kim, JM Myoung, I Yun 2009 IEEE Nanotechnology Materials and Devices Conference, 237-240, 2009 | 7 | 2009 |
| Predictive modeling and analysis of HfO2 thin film process based on Bayesian information criterion using PCA‐based neural networks YD Ko, P Moon, CE Kim, MH Ham, MK Jeong, A Garcia‐Diaz, JM Myoung, ... Surface and interface analysis 45 (9), 1334-1339, 2013 | 6 | 2013 |
| Optical bandgap modeling of thermal annealed ZnO: Ga thin films using neural networks CE Kim, P Moon, I Yun, S Kim, JM Myoung, HW Jang, J Bang physica status solidi (a) 207 (7), 1572-1576, 2010 | 4 | 2010 |
| Ink-jet printing process modeling using neural networks P Moon, CE Kim, D Kim, J Moon, I Yun 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology …, 2008 | 3 | 2008 |
| Device characteristics of InSnO thin-film transistors with a modulated channel CE Kim, I Yun Semiconductor Science and Technology 27 (12), 125006, 2012 | 2 | 2012 |
| Effects of the interfacial layer on electrical properties of TiO2-based high-k dielectric composite films CE Kim, I Yun ECS Transactions 45 (3), 89, 2012 | 2 | 2012 |
| Electrical characterization and conduction mechanism of high-k Ti1−xSixO2gate dielectrics CE Kim, P Moon, EN Cho, S Kim, JM Myoung, I Yun 2010 3rd International Nanoelectronics Conference (INEC), 242-243, 2010 | 2 | 2010 |
