| Reducing radiation damage in soft matter with femtosecond-timed single-electron packets EJ VandenBussche, DJ Flannigan Nano letters 19 (9), 6687-6694, 2019 | 73 | 2019 |
| Mitigating damage to hybrid perovskites using pulsed-beam TEM EJ VandenBussche, CP Clark, RJ Holmes, DJ Flannigan ACS omega 5 (49), 31867-31871, 2020 | 23 | 2020 |
| Sources of error in Debye–Waller-effect measurements relevant to studies of photoinduced structural dynamics EJ VandenBussche, DJ Flannigan Ultramicroscopy 196, 111-120, 2019 | 19 | 2019 |
| Low repetition-rate, high-resolution femtosecond transmission electron microscopy DJ Flannigan, WA Curtis, EJ VandenBussche, Y Zhang The Journal of chemical physics 157 (18), 2022 | 12 | 2022 |
| High-resolution analogue of time-domain phonon spectroscopy in the transmission electron microscope EJ VandenBussche, DJ Flannigan Philosophical Transactions of the Royal Society A 378 (2186), 20190598, 2020 | 9 | 2020 |
| Pulsed-beam transmission electron microscopy and radiation damage DJ Flannigan, EJ VandenBussche Micron, 103501, 2023 | 2 | 2023 |
| The Effect of a Pulsed Electron Beam on Damage Threshold EJ VandenBussche, DJ Flannigan Microscopy and Microanalysis 24 (S1), 2002-2003, 2018 | 2 | 2018 |
| Pulsed Electron Beams for Mitigating Damage in Next-generation Electronic Materials E VandenBussche, C Clark, R Holmes, D Flannigan Microscopy and Microanalysis 26 (S2), 2866-2868, 2020 | 1 | 2020 |
| Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage D Flannigan, E VandenBussche Microscopy and Microanalysis 26 (S2), 2066-2067, 2020 | 1 | 2020 |
| Reducing Radiation Damage Using Pulsed Electron Beams in the TEM EJ VandenBussche, DJ Flannigan Microscopy and Microanalysis 25 (S2), 1646-1647, 2019 | 1 | 2019 |
| Time-resolved TEM beyond fast detectors D Flannigan, J Chen, W Curtis, D Du, P Engen, E VandenBussche, ... Acta Crystallographica Section A: Foundations and Advances 77, C420-C420, 2021 | | 2021 |
| Supporting Data for Mitigating Damage to Hybrid Perovskites Using Pulsed-Beam TEM EJ VandenBussche, DJ Flannigan, RJ Holmes, CP Clark | | 2021 |
| The Use of Pulsed Electron Beams to Extend TEM Capabilities EJ VandenBussche University of Minnesota, 2021 | | 2021 |
| Using UEM to Probe Buried Structures in Real Space: An Analog to Phonon Spectroscopy E VandenBussche, D Flannigan Microscopy and Microanalysis 26 (S2), 216-217, 2020 | | 2020 |
| High-Resolution Analog of Time-Domain Phonon Spectroscopy in the TEM Experimental Data and Analysis 2019-2020 EJ VandenBussche, DJ Flannigan | | 2020 |
| Effects of Photoinduced Elastic Responses on Debye-Waller Temperature Measurements EJ VandenBussche, DJ Flannigan Microscopy and Microanalysis 24 (S1), 1896-1897, 2018 | | 2018 |
| 807–Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage D Flannigan, E VandenBussche | | |
| 1123–Pulsed Electron Beams for Mitigating Damage in Next-Generation Electronic Materials E VandenBussche, C Clark, R Holmes, D Flannigan | | |
