Donna Hurley
Donna Hurley
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Cited by
Cited by
Atomic force acoustic microscopy methods to determine thin-film elastic properties
DC Hurley, K Shen, NM Jennett, JA Turner
Journal of applied physics 94 (4), 2347-2354, 2003
Acoustic-phonon propagation in superlattices
SI Tamura, DC Hurley, JP Wolfe
Physical Review B 38 (2), 1427, 1988
Contact-resonance atomic force microscopy for viscoelasticity
PA Yuya, DC Hurley, JA Turner
Journal of Applied Physics 104 (7), 074916, 2008
Contact mechanics and tip shape in AFM-based nanomechanical measurements
M Kopycinska-Müller, RH Geiss, DC Hurley
Ultramicroscopy 106 (6), 466-474, 2006
Viscoelastic property mapping with contact resonance force microscopy
JP Killgore, DG Yablon, AH Tsou, A Gannepalli, PA Yuya, JA Turner, ...
Langmuir 27 (23), 13983-13987, 2011
Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods
DC Hurley, M Kopycinska-Mueller, AB Kos, RH Geiss
Measurement science and technology 16 (11), 2167, 2005
Elastic-property measurements of ultrathin films using atomic force acoustic microscopy
M Kopycinska-Mueller, RH Geiss, J Mueller, DC Hurley
Nanotechnology 16 (6), 703, 2005
Quantitative viscoelastic mapping of polyolefin blends with contact resonance atomic force microscopy
DG Yablon, A Gannepalli, R Proksch, J Killgore, DC Hurley, J Grabowski, ...
Macromolecules 45 (10), 4363-4370, 2012
Method and apparatus for a multi-channel multi-frequency data acquisition system for nondestructive eddy current inspection testing
JD Young, KH Hedengren, DC Hurley
US Patent 5,182,513, 1993
Quantitative subsurface contact resonance force microscopy of model polymer nanocomposites
JP Killgore, JY Kelly, CM Stafford, MJ Fasolka, DC Hurley
Nanotechnology 22 (17), 175706, 2011
Relationship between Q-factor and sample damping for contact resonance atomic force microscope measurement of viscoelastic properties
PA Yuya, DC Hurley, JA Turner
Journal of Applied Physics 109 (11), 113528, 2011
Determination of the nonlinear ultrasonic parameter using a Michelson interferometer
DC Hurley, CM Fortunko
Measurement Science and Technology 8 (6), 634, 1997
Nanomechanical mapping with resonance tracking scanned probe microscope
AB Kos, DC Hurley
Measurement Science and Technology 19 (1), 015504, 2007
Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard
ED Langlois, GA Shaw, JA Kramar, JR Pratt, DC Hurley
Review of Scientific Instruments 78 (9), 093705, 2007
Surface acoustic wave methods to determine the anisotropic elastic properties of thin films
DC Hurley, VK Tewary, AJ Richards
Measurement Science and Technology 12 (9), 1486, 2001
Nonlinear ultrasonic parameter in quenched martensitic steels
DC Hurley, D Balzar, PT Purtscher, KW Hollman
Journal of Applied Physics 83 (9), 4584-4588, 1998
Nanomechanical mapping of the osteochondral interface with contact resonance force microscopy and nanoindentation
SE Campbell, VL Ferguson, DC Hurley
Acta biomaterialia 8 (12), 4389-4396, 2012
Phonon focusing in cubic crystals
DC Hurley, JP Wolfe
Physical Review B 32 (4), 2568, 1985
Nanoscale characterization of natural fibers and their composites using contact-resonance force microscopy
SS Nair, S Wang, DC Hurley
Composites Part A: Applied Science and Manufacturing 41 (5), 624-631, 2010
Contact resonance force microscopy techniques for nanomechanical measurements
DC Hurley
Applied scanning probe methods XI, 97-138, 2009
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