| A reliability analysis of a deep neural network A Bosio, P Bernardi, A Ruospo, E Sanchez 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 81 | 2019 |
| Evaluating convolutional neural networks reliability depending on their data representation A Ruospo, A Bosio, A Ianne, E Sanchez 2020 23rd Euromicro Conference on Digital System Design (DSD), 672-679, 2020 | 36 | 2020 |
| Investigating data representation for efficient and reliable convolutional neural networks A Ruospo, E Sanchez, M Traiola, I O’connor, A Bosio Microprocessors and Microsystems 86, 104318, 2021 | 34 | 2021 |
| A pipelined multi-level fault injector for deep neural networks A Ruospo, A Balaara, A Bosio, E Sanchez 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 31 | 2020 |
| Emulating the effects of radiation-induced soft-errors for the reliability assessment of neural networks LM Luza, A Ruospo, D Söderström, C Cazzaniga, M Kastriotou, ... IEEE Transactions on Emerging Topics in Computing 10 (4), 1867-1882, 2021 | 24 | 2021 |
| On the reliability assessment of artificial neural networks running on ai-oriented mpsocs A Ruospo, E Sanchez Applied Sciences 11 (14), 6455, 2021 | 22 | 2021 |
| A survey on deep learning resilience assessment methodologies A Ruospo, E Sanchez, LM Luza, L Dilillo, M Traiola, A Bosio Computer 56 (2), 57-66, 2023 | 19 | 2023 |
| An open-source verification framework for open-source cores: A RISC-V case study PD Schiavone, E Sanchez, A Ruospo, F Minervini, F Zaruba, G Haugou, ... 2018 IFIP/IEEE International Conference on Very Large Scale Integration …, 2018 | 17 | 2018 |
| On-line testing for autonomous systems driven by risc-v processor design verification A Ruospo, R Cantoro, E Sanchez, PD Schiavone, A Garofalo, L Benini 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019 | 16 | 2019 |
| Assessing convolutional neural networks reliability through statistical fault injections A Ruospo, G Gavarini, C De Sio, J Guerrero, L Sterpone, MS Reorda, ... 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | 14 | 2023 |
| Selective hardening of critical neurons in deep neural networks A Ruospo, G Gavarini, I Bragaglia, M Traiola, A Bosio, E Sanchez 2022 25th International Symposium on Design and Diagnostics of Electronic …, 2022 | 13 | 2022 |
| Special session: AutoSoC-a suite of open-source automotive SoC benchmarks FA da Silva, AC Bagbaba, A Ruospo, R Mariani, G Kanawati, E Sanchez, ... 2020 IEEE 38th VLSI Test Symposium (VTS), 1-9, 2020 | 12 | 2020 |
| A suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices A Ruospo, D Piumatti, A Floridia, E Sánchez 2021 IEEE 27th International Symposium on On-Line Testing and Robust System …, 2021 | 10 | 2021 |
| Non-intrusive self-test library for automotive critical applications: Constraints and solutions P Bernardi, R Cantoro, A Floridia, D Piumatti, C Pogonea, A Ruospo, ... 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 920-923, 2019 | 9 | 2019 |
| Test, reliability and functional safety trends for automotive system-on-chip F Angione, D Appello, J Aribido, J Athavale, N Bellarmino, P Bernardi, ... 2022 IEEE European Test Symposium (ETS), 1-10, 2022 | 8 | 2022 |
| Pros and cons of fault injection approaches for the reliability assessment of deep neural networks A Ruospo, LM Luza, A Bosio, M Traiola, L Dilillo, E Sanchez 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-5, 2021 | 8 | 2021 |
| Simulation and formal: The best of both domains for instruction set verification of risc-v based processors C Duran, H Morales, C Rojas, A Ruospo, E Sanchez, E Roa 2020 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2020 | 7 | 2020 |
| Open-set recognition: an inexpensive strategy to increase dnn reliability G Gavarini, D Stucchi, A Ruospo, G Boracchi, E Sanchez 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 6 | 2022 |
| A model-based framework to assess the reliability of safety-critical applications LM Luza, A Ruospo, A Bosio, E Sanchez, L Dilillo 2021 24th International Symposium on Design and Diagnostics of Electronic …, 2021 | 6 | 2021 |
| Sci-fi: a smart, accurate and unintrusive fault-injector for deep neural networks G Gavarini, A Ruospo, E Sanchez 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | 5 | 2023 |
Ernesto SanchezAssociate Professor at Politecnico di TorinoVerified email at polito.it
