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Romain Tonneau
Romain Tonneau
Post-Doc IRE/UNamur
Verified email at unamur.be - Homepage
Title
Cited by
Cited by
Year
TiOx deposited by magnetron sputtering: a joint modelling and experimental study
R Tonneau, P Moskovkin, A Pflug, S Lucas
Journal of Physics D: Applied Physics 51 (19), 195202, 2018
312018
Correlation of structural and optical properties using virtual materials analysis
H Badorreck, M Steinecke, L Jensen, D Ristau, M Jupé, J Müller, ...
Optics Express 27 (16), 22209-22225, 2019
202019
Understanding the role of energetic particles during the growth of TiO2 thin films by reactive magnetron sputtering through multi-scale Monte Carlo simulations and experimental …
R Tonneau, P Moskovkin, J Muller, T Melzig, E Haye, S Konstantinidis, ...
Journal of Physics D: Applied Physics 54 (15), 155203, 2021
152021
Magnetron sputtering: determining scaling relations towards real power discharges using 3D particle-in-cell Monte Carlo models
R Tonneau, A Pflug, S Lucas
Plasma Sources Science and Technology 29 (11), 115007, 2020
62020
Comparison of experimental and Monte-Carlo simulation of MeV particle transport through tapered/straight glass capillaries and circular collimators
F Hespeels, R Tonneau, T Ikeda, S Lucas
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2015
52015
Plasma polymerization of cyclopropylamine in a low-pressure cylindrical magnetron reactor: A PIC-MC study of the roles of ions and radicals
S Mathioudaki, CR Vandenabeele, R Tonneau, A Pflug, J Tennyson, ...
Journal of Vacuum Science & Technology A 38 (3), 2020
42020
Do Pure Water-Radiolysis Experiments Truly Unlock the Secrets of the FLASH Effect? A Numerical Revelation
R Tonneau, S Lucas, AC Heuskin
2023
Plasma polymerization of cyclopropylamine in a low-pressure cylindrical magnetron reactor
S Mathioudaki, C Vandenabeele, R Tonneau, A Pflug, J Tennyson, ...
2020
TiOx deposited by magnetron sputtering
R Tonneau, P Moskovkin, A Pflug, S Lucas
2018
Simulations of oxide films growth deposited by magnetron sputtering and evaluation of their morphology and optical properties
R Tonneau, P Moskovkin, S Lucas
2018
THESIS/THÈSE
R Tonneau
Atomistic modelling of thin film growth with realistic input data obtained from reactor-scale process simulation ICME 2016
A Pflug, T Melzig, M Siemers, K Schiffmann, M Vergöhl, G Bräuer, ...
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