Yoosuf N. Picard
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Focused ion beam-shaped microtools for ultra-precision machining of cylindrical components
YN Picard, DP Adams, MJ Vasile, MB Ritchey
Precision Engineering 27 (1), 59-69, 2003
Femtosecond laser micromachining of a single-crystal superalloy
Q Feng, YN Picard, H Liu, SM Yalisove, G Mourou, TM Pollock
Scripta Materialia 53 (5), 511-516, 2005
Cathodoluminescence Studies of the Inhomogeneities in Sn-doped Ga2O3 Nanowires
SI Maximenko, L Mazeina, YN Picard, JA Freitas Jr, VM Bermudez, ...
Nano letters 9 (9), 3245-3251, 2009
Oxygen Vacancy Creation, Drift, and Aggregation in TiO2‐Based Resistive Switches at Low Temperature and Voltage
J Kwon, AA Sharma, JA Bain, YN Picard, M Skowronski
Advanced Functional Materials 25 (19), 2876-2883, 2015
Pulsed laser ignition of reactive multilayer films
YN Picard, DP Adams, JA Palmer, SM Yalisove
Applied Physics Letters 88 (14), 144102, 2006
Femtosecond laser machining of single-crystal superalloys through thermal barrier coatings
Q Feng, YN Picard, JP McDonald, PA Van Rompay, SM Yalisove, ...
Materials Science and Engineering: A 430 (1-2), 203-207, 2006
Electron channeling contrast imaging of atomic steps and threading dislocations in
YN Picard, ME Twigg, JD Caldwell, CR Eddy Jr, PG Neudeck, AJ Trunek, ...
Applied physics letters 90 (23), 234101, 2007
Resolving the Burgers vector for individual GaN dislocations by electron channeling contrast imaging
YN Picard, ME Twigg, JD Caldwell, CR Eddy Jr, MA Mastro, RT Holm
Scripta Materialia 61 (8), 773-776, 2009
Nondestructive analysis of threading dislocations in GaN by electron channeling contrast imaging
YN Picard, JD Caldwell, ME Twigg, CR Eddy Jr, MA Mastro, RL Henry, ...
Applied Physics Letters 91 (9), 094106, 2007
Rapid misfit dislocation characterization in heteroepitaxial III-V/Si thin films by electron channeling contrast imaging
SD Carnevale, JI Deitz, JA Carlin, YN Picard, M De Graef, SA Ringel, ...
Applied Physics Letters 104 (23), 232111, 2014
Controlled Growth of Parallel Oriented ZnO Nanostructural Arrays on Ga2O3 Nanowires
L Mazeina, YN Picard, SM Prokes
Crystal Growth and Design 9 (2), 1164-1169, 2009
Theory of dynamical electron channeling contrast images of near-surface crystal defects
YN Picard, M Liu, J Lammatao, R Kamaladasa, M De Graef
Ultramicroscopy 146, 71-78, 2014
High-Throughput Characterization of Surface Segregation in CuxPd1–x Alloys
D Priyadarshini, P Kondratyuk, YN Picard, BD Morreale, AJ Gellman, ...
The Journal of Physical Chemistry C 115 (20), 10155-10163, 2011
Basic principles and application of electron channeling in a scanning electron microscope for dislocation analysis
RJ Kamaladasa, YN Picard
Microscopy: science, technology, applications and education 3, 1583-1590, 2010
Growth of Sn-Doped β-Ga2O3 Nanowires and Ga2O3−SnO2 Heterostructures for Gas Sensing Applications
L Mazeina, YN Picard, SI Maximenko, FK Perkins, ER Glaser, ME Twigg, ...
Crystal growth & design 9 (10), 4471-4479, 2009
Impact of Joule heating on the microstructure of nanoscale TiO2 resistive switching devices
Y Meng Lu, M Noman, YN Picard, JA Bain, PA Salvador, M Skowronski
Journal of Applied Physics 113 (16), 163703, 2013
In Situ TEM Imaging of Defect Dynamics under Electrical Bias in Resistive Switching Rutile-TiO2
RJ Kamaladasa, AA Sharma, YT Lai, W Chen, PA Salvador, JA Bain, ...
Microscopy and Microanalysis 21 (1), 140-153, 2015
Direct observation of basal-plane to threading-edge dislocation conversion in 4H-SiC epitaxy
S Chung, V Wheeler, R Myers-Ward, CR Eddy Jr, DK Gaskill, P Wu, ...
Journal of applied physics 109 (9), 094906, 2011
Diffraction contrast and Bragg reflection determination in forescattered electron channeling contrast images of threading screw dislocations in
YN Picard, ME Twigg
Journal of Applied Physics 104 (12), 124906, 2008
Applications of electron channeling contrast imaging for the rapid characterization of extended defects in III–V/Si heterostructures
SD Carnevale, JI Deitz, JA Carlin, YN Picard, DW McComb, M De Graef, ...
IEEE Journal of Photovoltaics 5 (2), 676-682, 2014
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