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Aaron Thean
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Cited by
Year
Efficient Machine Learning-assisted Failure Analysis Method for Circuit-level Defect Prediction
J Ghosh
Machine Learning with Applications, 100537, 2024
2024
Spatially reconfigurable antiferromagnetic states in topologically rich free-standing nanomembranes
H Jani, J Harrison, S Hooda, S Prakash, P Nandi, J Hu, Z Zeng, JC Lin, ...
Nature Materials, 1-8, 2024
12024
First Demonstration of HZO-LNOI Integrated Ferroelectric Electro-Optic Modulator and Memory to Enable Reconfigurable Photonic Systems
Z Xu, CK Chen, HL Lin, Y Gao, W Ke, B Xu, P Dmitriev, C Arbiz, ...
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
2023
Negative-U Defect Passivation in Oxide-Semiconductor by Channel Defect Self-Compensation Effect to Achieve Low Bias Stress VTH Instability of Low-Thermal …
CK Chen, Z Xu, S Hooda, J Pan, E Zamburg, AVY Thean
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
2023
A Low-Latency DNN Accelerator Enabled by DFT-Based Convolution Execution Within Crossbar Arrays
H Veluri, U Chand, CK Chen, AVY Thean
IEEE Transactions on Neural Networks and Learning Systems, 2023
2023
N‐P Reconfigurable Dual‐Mode Memtransistors for Compact Bio‐Inspired Feature Extractor with Inhibitory‐Excitatory Spiking Capability
JF Leong, Z Fang, M Sivan, J Pan, B Tang, E Zamburg, AVY Thean
Advanced Functional Materials 33 (45), 2302949, 2023
42023
A dual-domain 3ω method for measuring the in-plane thermal conductivity of high-conductive thin films
P Liu, Y Wen, CF Siah, ME Pam, B Xu, AVY Thean, YK Lim, S Shin
Applied Physics Letters 122 (25), 2023
12023
Overcoming Negative nFET VTH by Defect-Compensated Low-Thermal Budget ITO-IGZO Hetero-Oxide Channel to Achieve Record Mobility and Enhancement …
S Hooda, CK Chen, M Lal, SH Tsai, E Zamburg, AVY Thean
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2023
62023
Quantile Online Learning for Semiconductor Failure Analysis
B Zhou, P Jieming, M Sivan, AVY Thean, J Senthilnath
ICASSP 2023-2023 IEEE International Conference on Acoustics, Speech and …, 2023
2023
Multi-Axial Elastic Averaging for Sub-Micron Passive Alignment of Photonic Components
SCK Goh, CF Siah, B Xu, Y Zhang, ME Pam, E Guevarra, ESP Goh, ...
Journal of Lightwave Technology, 2023
2023
Présentation du GIP-CNFM-CIME Nanotech
A Aitoumeri
Abdelhamid Aitoumeri, 2023
2023
Technology roadmap for flexible sensors
Y Luo, MR Abidian, JH Ahn, D Akinwande, AM Andrews, M Antonietti, ...
ACS nano 17 (6), 5211-5295, 2023
2762023
BEOL Compatible Extremely Scaled Bilayer ITO/IGZO Channel FET with High Mobility 106 cm2/V.s
S Hooda, M Lal, C Chun-Kuei, SH Tsai, E Zamburg, AVY Thean
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-4, 2023
2023
Back-End-of-Line-Compatible Anneal-Free Ferroelectric Field-Effect Transistor
SH Tsai, Z Li, MMME Phyu, Z Fang, S Hooda, CK Chen, E Zamburg, ...
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023
2023
Spatially reconfigurable topological textures in freestanding antiferromagnetic nanomembranes
H Jani, J Harrison, S Hooda, S Prakash, P Nandi, J Hu, Z Zeng, JC Lin, ...
arXiv preprint arXiv:2303.03217, 2023
12023
High-Performance Top-Gated and Double-Gated Oxide–Semiconductor Ferroelectric Field-Effect Transistor Enabled by Channel Defect Self-Compensation Effect
CK Chen, S Hooda, Z Fang, M Lal, Z Xu, J Pan, SH Tsai, E Zamburg, ...
IEEE Transactions on Electron Devices 70 (4), 2098-2105, 2023
22023
Extremely scaled hetero-junction channel TFT for advanced electronics
S Devi, M Lal, U Chand, W Xinghua, C Chun-Kuei, E Zamburg, ...
APS March Meeting Abstracts 2023, W34. 011, 2023
2023
Device architectures with tensile and compressive strained substrates
BY Nguyen, C Maleville, W Schwarzenbach, G Xiao, A Thean, C Sun, ...
US Patent App. 17/347,417, 2022
2022
Low-thermal-budget beol-compatible beyond-silicon transistor technologies for future monolithic-3d compute and memory applications
A Thean, SH Tsai, CK Chen, M Sivan, B Tang, S Hooda, Z Fang, J Pan, ...
2022 International Electron Devices Meeting (IEDM), 12.2. 1-12.2. 4, 2022
32022
First Demonstration of Ultra-low Dit Top-Gated Ferroelectric Oxide-Semiconductor Memtransistor with Record Performance by Channel Defect Self-Compensation …
CK Chen, Z Fang, S Hooda, M Lal, U Chand, Z Xu, J Pan, SH Tsai, ...
2022 International Electron Devices Meeting (IEDM), 6.1. 1-6.1. 4, 2022
72022
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