Efficient Machine Learning-assisted Failure Analysis Method for Circuit-level Defect Prediction J Ghosh Machine Learning with Applications, 100537, 2024 | | 2024 |
Spatially reconfigurable antiferromagnetic states in topologically rich free-standing nanomembranes H Jani, J Harrison, S Hooda, S Prakash, P Nandi, J Hu, Z Zeng, JC Lin, ... Nature Materials, 1-8, 2024 | 1 | 2024 |
First Demonstration of HZO-LNOI Integrated Ferroelectric Electro-Optic Modulator and Memory to Enable Reconfigurable Photonic Systems Z Xu, CK Chen, HL Lin, Y Gao, W Ke, B Xu, P Dmitriev, C Arbiz, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
Negative-U Defect Passivation in Oxide-Semiconductor by Channel Defect Self-Compensation Effect to Achieve Low Bias Stress VTH Instability of Low-Thermal … CK Chen, Z Xu, S Hooda, J Pan, E Zamburg, AVY Thean 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
A Low-Latency DNN Accelerator Enabled by DFT-Based Convolution Execution Within Crossbar Arrays H Veluri, U Chand, CK Chen, AVY Thean IEEE Transactions on Neural Networks and Learning Systems, 2023 | | 2023 |
N‐P Reconfigurable Dual‐Mode Memtransistors for Compact Bio‐Inspired Feature Extractor with Inhibitory‐Excitatory Spiking Capability JF Leong, Z Fang, M Sivan, J Pan, B Tang, E Zamburg, AVY Thean Advanced Functional Materials 33 (45), 2302949, 2023 | 4 | 2023 |
A dual-domain 3ω method for measuring the in-plane thermal conductivity of high-conductive thin films P Liu, Y Wen, CF Siah, ME Pam, B Xu, AVY Thean, YK Lim, S Shin Applied Physics Letters 122 (25), 2023 | 1 | 2023 |
Overcoming Negative nFET VTH by Defect-Compensated Low-Thermal Budget ITO-IGZO Hetero-Oxide Channel to Achieve Record Mobility and Enhancement … S Hooda, CK Chen, M Lal, SH Tsai, E Zamburg, AVY Thean 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2023 | 6 | 2023 |
Quantile Online Learning for Semiconductor Failure Analysis B Zhou, P Jieming, M Sivan, AVY Thean, J Senthilnath ICASSP 2023-2023 IEEE International Conference on Acoustics, Speech and …, 2023 | | 2023 |
Multi-Axial Elastic Averaging for Sub-Micron Passive Alignment of Photonic Components SCK Goh, CF Siah, B Xu, Y Zhang, ME Pam, E Guevarra, ESP Goh, ... Journal of Lightwave Technology, 2023 | | 2023 |
Présentation du GIP-CNFM-CIME Nanotech A Aitoumeri Abdelhamid Aitoumeri, 2023 | | 2023 |
Technology roadmap for flexible sensors Y Luo, MR Abidian, JH Ahn, D Akinwande, AM Andrews, M Antonietti, ... ACS nano 17 (6), 5211-5295, 2023 | 276 | 2023 |
BEOL Compatible Extremely Scaled Bilayer ITO/IGZO Channel FET with High Mobility 106 cm2/V.s S Hooda, M Lal, C Chun-Kuei, SH Tsai, E Zamburg, AVY Thean 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-4, 2023 | | 2023 |
Back-End-of-Line-Compatible Anneal-Free Ferroelectric Field-Effect Transistor SH Tsai, Z Li, MMME Phyu, Z Fang, S Hooda, CK Chen, E Zamburg, ... 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023 | | 2023 |
Spatially reconfigurable topological textures in freestanding antiferromagnetic nanomembranes H Jani, J Harrison, S Hooda, S Prakash, P Nandi, J Hu, Z Zeng, JC Lin, ... arXiv preprint arXiv:2303.03217, 2023 | 1 | 2023 |
High-Performance Top-Gated and Double-Gated Oxide–Semiconductor Ferroelectric Field-Effect Transistor Enabled by Channel Defect Self-Compensation Effect CK Chen, S Hooda, Z Fang, M Lal, Z Xu, J Pan, SH Tsai, E Zamburg, ... IEEE Transactions on Electron Devices 70 (4), 2098-2105, 2023 | 2 | 2023 |
Extremely scaled hetero-junction channel TFT for advanced electronics S Devi, M Lal, U Chand, W Xinghua, C Chun-Kuei, E Zamburg, ... APS March Meeting Abstracts 2023, W34. 011, 2023 | | 2023 |
Device architectures with tensile and compressive strained substrates BY Nguyen, C Maleville, W Schwarzenbach, G Xiao, A Thean, C Sun, ... US Patent App. 17/347,417, 2022 | | 2022 |
Low-thermal-budget beol-compatible beyond-silicon transistor technologies for future monolithic-3d compute and memory applications A Thean, SH Tsai, CK Chen, M Sivan, B Tang, S Hooda, Z Fang, J Pan, ... 2022 International Electron Devices Meeting (IEDM), 12.2. 1-12.2. 4, 2022 | 3 | 2022 |
First Demonstration of Ultra-low Dit Top-Gated Ferroelectric Oxide-Semiconductor Memtransistor with Record Performance by Channel Defect Self-Compensation … CK Chen, Z Fang, S Hooda, M Lal, U Chand, Z Xu, J Pan, SH Tsai, ... 2022 International Electron Devices Meeting (IEDM), 6.1. 1-6.1. 4, 2022 | 7 | 2022 |