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Peter Kury
Peter Kury
out-of-the-box systems GmbH
Verified email at uni-due.de
Title
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Cited by
Year
Compact and transferable threefold evaporator for molecular beam epitaxy in ultrahigh vacuum
P Kury, R Hild, D Thien, HL Günter, FJ Meyer zu Heringdorf, M Hoegen
Review of scientific instruments 76 (8), 2005
422005
Interplay of surface morphology, strain relief, and surface stress during surfactant mediated epitaxy of Ge on Si
P Zahl, P Kury, M Horn von Hoegen
Applied Physics A 69, 481-488, 1999
421999
Surfactant-mediated epitaxy of Ge on Si (111): Beyond the surface
T Schmidt, R Kröger, T Clausen, J Falta, A Janzen, M Kammler, P Kury, ...
Applied Physics Letters 86 (11), 2005
382005
Less strain energy despite fewer misfit dislocations: the impact of ordering
T Schmidt, R Kröger, JI Flege, T Clausen, J Falta, A Janzen, P Zahl, ...
Physical review letters 96 (6), 066101, 2006
222006
Strain relief during Ge hut cluster formation on Si (001) studied by high-resolution LEED and surface-stress-induced optical deflection
M Horn-von Hoegen, BH Müller, T Grabosch, P Kury
Physical Review B 70 (23), 235313, 2004
212004
Impact of thermal dependence of elastic constants on surface stress measurements
P Kury, M Horn-von Hoegen
Review of scientific instruments 75 (5), 1357-1358, 2004
142004
Disorder-mediated ordering by self-interfactant effect in organic thin film growth of pentacene on silicon
P Kury, KR Roos, D Thien, S Möllenbeck, D Wall, M Horn-von Hoegen, ...
Organic electronics 9 (4), 461-465, 2008
132008
SSIOD: The next generation
P Kury, T Grabosch, M Horn-von Hoegen
Review of Scientific Instruments 76 (2), 2005
112005
Domain sensitive contrast in photoelectron emission microscopy
D Thien, P Kury, M Horn-von Hoegen, FJM zu Heringdorf, J van Heys, ...
Physical review letters 99 (19), 196102, 2007
92007
Absence of surface stress change during pentacene thin film growth on the Si (111)-(7× 7) surface: a buried reconstruction interface
P Kury, KR Roos, M Horn-von Hoegen, FJM zu Heringdorf
New Journal of Physics 10 (2), 023037, 2008
82008
Horn von Ho egen M
R Kroger, JI Flege, T Clausen, J Falta, A Janzen, P Zahl, P Kury, ...
Phys. Rev. Let 96, 066101, 2006
52006
Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures
P Kury, P Zahl, M Horn-von Hoegen, C Voges, H Frischat, HL Günter, ...
Review of scientific instruments 75 (11), 4911-4915, 2004
52004
Precise calibration for surface stress induced optical deflection measurements
P Kury, P Zahl, MH Hoegen
Review of scientific instruments 75 (6), 2211-2212, 2004
52004
Direct observation of reconstruction induced changes of surface stress for Sb on Si (111)
P Kury, P Zahl, M Horn-von Hoegen
Analytical and bioanalytical chemistry 379, 582-587, 2004
52004
Method for determining an axial tensile force applied to a component
P Kury, D Hänsel
US Patent 10,436,657, 2019
42019
Annular clamping nut for a tie bar
D Hofsommer, K Kolk, P Kury, M Richter, M Schulz, D Springborn
US Patent 10,422,225, 2019
42019
High-precision determination of the mass proportion of a component in a multi-component fluid
G Braun, P Kury
US Patent 9,200,935, 2015
32015
Rotor with sealing element and ring seal
P Schroder, K Kolk, P Kury, D Springborn, K Kampka, CW Ross, ...
US Patent 11,319,823, 2022
22022
Verspannungseffekte bei der Epitaxie organischer Halbleiter: Pentazen/Si (111)
P Kury
Shaker, 2008
22008
Increasing the scan speed in high resolution, low energy electron diffraction measurements by presetting the gate time
AJ Kny, M Sokolowski, P Kury
Review of Scientific Instruments 94 (6), 2023
12023
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