| A Comprehensive Study of the Short-circuit Ruggedness of Silicon Carbide Power MOSFETs G Romano, A Fayyaz, M Riccio, L Maresca, G Breglio, A Castellazzi, ... IEEE Journal of Emerging and Selected Topics in Power Electronics, 1-1, 2016 | 259 | 2016 |
| SiC power MOSFETs performance, robustness and technology maturity A Castellazzi, A Fayyaz, L Romano, Gianpaolo, Yang, M Riccio, A Irace Microelectronics Reliability 57, 2016 | 136 | 2016 |
| Short-circuit failure mechanism of SiC power MOSFETs G Romano, L Maresca, M Riccio, V d'Alessandro, G Breglio, A Irace, ... 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's …, 2015 | 101 | 2015 |
| Short-circuit robustness of SiC power MOSFETs: Experimental analysis A Castellazzi, A Fayyaz, L Yang, M Riccio, A Irace 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014 | 80 | 2014 |
| Experimental detection and numerical validation of different failure mechanisms in IGBTs during unclamped inductive switching G Breglio, A Irace, E Napoli, M Riccio, P Spirito IEEE Transactions on Electron Devices 60 (2), 563-570, 2012 | 78 | 2012 |
| A temperature-dependent SPICE model of SiC Power MOSFETs for within and out-of-SOA simulations M Riccio, V d'Alessandro, G Romano, L Maresca, G Breglio, A Irace IEEE Transactions on Power Electronics, 1-1, 2017 | 77 | 2017 |
| Experimental analysis of electro-thermal instability in SiC Power MOSFETs M Riccio, A Castellazzi, G De Falco, A Irace Microelectronics Reliability 53 (9-11), 1739-1744, 2013 | 66 | 2013 |
| UIS failure mechanism of SiC power MOSFETs A Fayyaz, A Castellazzi, G Romano, M Riccio, A Irace, J Urresti, N Wright 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2016 | 60 | 2016 |
| SPICE modeling and dynamic electrothermal simulation of SiC power MOSFETs V d'Alessandro, A Magnani, M Riccio, G Breglio, A Irace, N Rinaldi, ... 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014 | 52 | 2014 |
| Relationship between albuminuric CKD and diabetic retinopathy in a real-world setting of type 2 diabetes: Findings from No blind study FC Sasso, PC Pafundi, A Gelso, V Bono, C Costagliola, R Marfella, ... Nutrition, Metabolism and Cardiovascular Diseases 29 (9), 923-930, 2019 | 51 | 2019 |
| Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs A Borghese, M Riccio, A Fayyaz, A Castellazzi, L Maresca, G Breglio, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019 | 51 | 2019 |
| A comprehensive study on the avalanche breakdown robustness of silicon carbide power MOSFETs A Fayyaz, G Romano, J Urresti, M Riccio, A Castellazzi, A Irace, N Wright Energies 10 (4), 452, 2017 | 49 | 2017 |
| Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs AI A. Fayyaz, , L. Yang, M. Riccio, A. Castellazzi Microelectronics Reliability, 2014 | 45 | 2014 |
| Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: Experiments and simulations M Riccio, A Irace, G Breglio, P Spirito, E Napoli, Y Mizuno 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and …, 2011 | 45 | 2011 |
| 50W X-band GaN MMIC HPA: Effective power capability and transient thermal analysis C Costrini, A Cetronio, P Romanini, G Breglio, A Irace, M Riccio The 40th European Microwave Conference, 1650-1653, 2010 | 36 | 2010 |
| Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations V d’Alessandro, A Magnani, M Riccio, Y Iwahashi, G Breglio, N Rinaldi, ... Microelectronics Reliability 53 (9-11), 1713-1718, 2013 | 35 | 2013 |
| Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography M Riccio, L Rossi, A Irace, E Napoli, G Breglio, P Spirito, R Tagami, ... Microelectronics Reliability 50 (9-11), 1725-1730, 2010 | 35 | 2010 |
| Investigation on the short-circuit oscillation of cascode GaN HEMTs P Xue, L Maresca, M Riccio, G Breglio, A Irace IEEE Transactions on Power Electronics 35 (6), 6292-6300, 2019 | 33 | 2019 |
| Influence of the SiC/SiO2 SiC MOSFET Interface Traps Distribution on C–V Measurements Evaluated by TCAD Simulations L Maresca, I Matacena, M Riccio, A Irace, G Breglio, S Daliento IEEE Journal of Emerging and Selected Topics in Power Electronics 9 (2 …, 2019 | 33 | 2019 |
| Influence of design parameters on the short-circuit ruggedness of SiC power MOSFETs G Romano, M Riccio, L Maresca, G Breglio, A Irace, A Fayyaz, ... 2016 28th International Symposium on Power Semiconductor Devices and ICs …, 2016 | 33 | 2016 |
prof. Andrea IraceUniversity of Naples Federico IIVerified email at unina.it
