| Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events E Di Russo, I Blum, J Houard, M Gilbert, G Da Costa, D Blavette, L Rigutti Ultramicroscopy 187, 126-134, 2018 | 39 | 2018 |
| Composition metrology of ternary semiconductor alloys analyzed by atom probe tomography E Di Russo, F Moyon, N Gogneau, L Largeau, E Giraud, JF Carlin, ... The Journal of Physical Chemistry C 122 (29), 16704-16714, 2018 | 30 | 2018 |
| Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers L Rigutti, L Mancini, W Lefebvre, J Houard, D Hernàndez-Maldonado, ... Semiconductor Science and Technology 31 (9), 095009, 2016 | 30 | 2016 |
| Three-dimensional atomic-scale investigation of ZnO-MgxZn1− xO m-plane heterostructures E Di Russo, L Mancini, F Moyon, S Moldovan, J Houard, FH Julien, ... Applied Physics Letters 111 (3), 2017 | 29 | 2017 |
| Thermal robustness of magnetic tunnel junctions with perpendicular shape anisotropy S Lequeux, N Perrissin, G Grégoire, L Tillie, A Chavent, N Strelkov, L Vila, ... Nanoscale 12 (11), 6378-6384, 2020 | 27 | 2020 |
| Field-dependent measurement of GaAs composition by atom probe tomography E Di Russo, I Blum, J Houard, G Da Costa, D Blavette, L Rigutti Microscopy and Microanalysis 23 (6), 1067-1075, 2017 | 26 | 2017 |
| A photonic atom probe coupling 3D atomic scale analysis with in situ photoluminescence spectroscopy J Houard, A Normand, E Di Russo, C Bacchi, P Dalapati, G Beainy, ... Review of Scientific Instruments 91 (8), 2020 | 20 | 2020 |
| Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes E Di Russo, N Cherkashin, M Korytov, AE Nikolaev, AV Sakharov, ... Journal of Applied Physics 126 (12), 2019 | 20 | 2019 |
| Three-dimensional measurement of Mg dopant distribution and electrical activity in GaN by correlative atom probe tomography and off-axis electron holography L Amichi, I Mouton, E Di Russo, V Boureau, F Barbier, A Dussaigne, ... Journal of Applied Physics 127 (6), 2020 | 19 | 2020 |
| Segregation scheme of indium in AlGaInAs nanowire shells L Francaviglia, G Tütüncüoglu, S Martí-Sánchez, E Di Russo, SE Steinvall, ... Physical Review Materials 3 (2), 023001, 2019 | 17 | 2019 |
| Dissociation of GaN2+ and AlN2+ in APT: Analysis of experimental measurements D Zanuttini, I Blum, E Di Russo, L Rigutti, F Vurpillot, J Douady, E Jacquet, ... The Journal of Chemical Physics 149 (13), 2018 | 15 | 2018 |
| Correlative investigation of Mg doping in GaN layers grown at different temperatures by atom probe tomography and off-axis electron holography L Amichi, I Mouton, V Boureau, E Di Russo, P Vennegues, P De Mierry, ... Nanotechnology 31 (4), 045702, 2019 | 14 | 2019 |
| Solubility limit of Ge dopants in AlGaN: A chemical and microstructural investigation down to the nanoscale C Bougerol, E Robin, E Di Russo, E Bellet-Amalric, V Grenier, A Ajay, ... ACS Applied Materials & Interfaces 13 (3), 4165-4173, 2021 | 9 | 2021 |
| Super-resolution optical spectroscopy of nanoscale emitters within a photonic atom probe E Di Russo, P Dalapati, J Houard, L Venturi, I Blum, S Moldovan, ... Nano Letters 20 (12), 8733-8738, 2020 | 9 | 2020 |
| InGaN quantum dots studied by correlative microscopy techniques for enhanced light-emitting diodes I Dimkou, E Di Russo, P Dalapati, J Houard, N Rochat, D Cooper, ... ACS Applied Nano Materials 3 (10), 10133-10143, 2020 | 9 | 2020 |
| In Situ Spectroscopic Study of the Optomechanical Properties of Evaporating Field Ion Emitters P Dalapati, G Beainy, E Di Russo, I Blum, J Houard, S Moldovan, A Vella, ... Physical Review Applied 15 (2), 024014, 2021 | 8 | 2021 |
| Detecting dissociation dynamics of phosphorus molecular ions by atom probe tomography E Di Russo, I Blum, I Rivalta, J Houard, G Da Costa, F Vurpillot, D Blavette, ... The Journal of Physical Chemistry A 124 (52), 10977-10988, 2020 | 8 | 2020 |
| Study of the physical mechanisms leading to compositional biases in atom probe tomography of semiconductors E Di Russo Normandie Université, 2018 | 8 | 2018 |
| Multi-microscopy nanoscale characterization of the doping profile in a hybrid Mg/Ge-doped tunnel junction E Di Russo, A Mavel, VF Arcara, B Damilano, I Dimkou, S Vézian, ... Nanotechnology 31 (46), 465706, 2020 | 7 | 2020 |
| Synthesis of relaxed Ge0. 9Sn0. 1/Ge by nanosecond pulsed laser melting E Di Russo, F Sgarbossa, P Ranieri, G Maggioni, S Ndiaye, S Duguay, ... Applied Surface Science 612, 155817, 2023 | 6 | 2023 |
