Fuccio CRISTIANO
Fuccio CRISTIANO
LAAS-CNRS Toulouse, France
Verified email at laas.fr
Title
Cited by
Cited by
Year
Energetics of self-interstitial clusters in Si
NEB Cowern, G Mannino, PA Stolk, F Roozeboom, HGA Huizing, ...
Physical Review Letters 82 (22), 4460, 1999
3951999
Extended defects in shallow implants
A Claverie, B Colombeau, B De Mauduit, C Bonafos, X Hebras, ...
Applied Physics A 76 (7), 1025-1033, 2003
1802003
Engineering strained silicon on insulator wafers with the Smart CutTM technology
B Ghyselen, JM Hartmann, T Ernst, C Aulnette, B Osternaud, ...
Solid-state electronics 48 (8), 1285-1296, 2004
1522004
Evidence on the mechanism of boron deactivation in Ge-preamorphized ultrashallow junctions
BJ Pawlak, R Surdeanu, B Colombeau, AJ Smith, NEB Cowern, ...
Applied Physics Letters 84 (12), 2055-2057, 2004
1242004
Formation energies and relative stability of perfect and faulted dislocation loops in silicon
F Cristiano, J Grisolia, B Colombeau, M Omri, B De Mauduit, A Claverie, ...
Journal of Applied Physics 87 (12), 8420-8428, 2000
1192000
Visible photoluminescence at room temperature from microcrystalline silicon precipitates in SiO2 formed by ion implantation
T Komoda, J Kelly, F Cristiano, A Nejim, PLF Hemment, KP Homewood, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1995
1071995
Mechanisms of B deactivation control by F co-implantation
NEB Cowern, B Colombeau, J Benson, AJ Smith, W Lerch, S Paul, T Graf, ...
Applied Physics Letters 86 (10), 101905, 2005
922005
Advanced activation of ultra-shallow junctions using flash-assisted RTP
W Lerch, S Paul, J Niess, S McCoy, T Selinger, J Gelpey, F Cristiano, ...
Materials Science and Engineering: B 124, 24-31, 2005
822005
Thermal evolution of extended defects in implanted Si:: impact on dopant diffusion
A Claverie, B Colombeau, GB Assayag, C Bonafos, F Cristiano, M Omri, ...
Materials Science in Semiconductor Processing 3 (4), 269-277, 2000
822000
Clusters formation in ultralow-energy high-dose boron-implanted silicon
F Cristiano, X Hebras, N Cherkashin, A Claverie, W Lerch, S Paul
Applied physics letters 83 (26), 5407-5409, 2003
782003
A physically based model for the spatial and temporal evolution of self-interstitial agglomerates in ion-implanted silicon
CJ Ortiz, P Pichler, T Fühner, F Cristiano, B Colombeau, NEB Cowern, ...
Journal of applied physics 96 (9), 4866-4877, 2004
752004
Reduced pressure chemical vapour deposition of SiGe virtual substrates for high mobility devices
JM Hartmann, Y Bogumilowicz, P Holliger, F Laugier, R Truche, ...
Semiconductor science and technology 19 (3), 311, 2003
572003
Kinetic aspects of the growth of platelets and voids in H implanted Si
J Grisolia, F Cristiano, GB Assayag, A Claverie
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2001
572001
Ion beam induced defects in crystalline silicon
F Cristiano, N Cherkashin, X Hebras, P Calvo, Y Lamrani, E Scheid, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004
562004
Direct imaging of boron segregation to extended defects in silicon
S Duguay, T Philippe, F Cristiano, D Blavette
Applied Physics Letters 97 (24), 242104, 2010
542010
Deactivation of ultrashallow boron implants in preamorphized silicon after nonmelt laser annealing with multiple scans
JA Sharp, NEB Cowern, RP Webb, KJ Kirkby, D Giubertoni, S Gennaro, ...
Applied physics letters 89 (19), 192105, 2006
472006
Evolution of boron-interstitial clusters in crystalline Si studied by transmission electron microscopy
S Boninelli, S Mirabella, E Bruno, F Priolo, F Cristiano, A Claverie, ...
Applied Physics Letters 91 (3), 031905, 2007
462007
Thermal stability of boron electrical activation in preamorphised ultra-shallow junctions
F Cristiano, N Cherkashin, P Calvo, Y Lamrani, X Hebras, A Claverie, ...
Materials Science and Engineering: B 114, 174-179, 2004
462004
Comprehensive study of the electron scattering mechanisms in 4H-SiC MOSFETs
V Uhnevionak, A Burenkov, C Strenger, G Ortiz, E Bedel-Pereira, V Mortet, ...
IEEE Transactions on Electron Devices 62 (8), 2562-2570, 2015
452015
Atomistic simulations of extrinsic defects evolution and transient enhanced diffusion in silicon
B Colombeau, F Cristiano, A Altibelli, C Bonafos, GB Assayag, A Claverie
Applied Physics Letters 78 (7), 940-942, 2001
422001
The system can't perform the operation now. Try again later.
Articles 1–20