| High-harmonic generation by resonant plasmon field enhancement S Kim, J Jin, YJ Kim, IY Park, Y Kim, SW Kim Nature 453 (7196), 757-760, 2008 | 1624 | 2008 |
| Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser J Jin, YJ Kim, Y Kim, SW Kim, CS Kang Optics Express 14 (13), 5968-5974, 2006 | 163 | 2006 |
| Thickness and refractive index measurement of a silicon wafer based on an optical comb J Jin, JW Kim, CS Kang, JA Kim, TB Eom Optics express 18 (17), 18339-18346, 2010 | 123 | 2010 |
| Absolute length measurement with the frequency comb of a femtosecond laser S Hyun, YJ Kim, Y Kim, J Jin, SW Kim Measurement Science and Technology 20 (9), 095302, 2009 | 122 | 2009 |
| A review of thickness measurements of thick transparent layers using optical interferometry J Park, JA Kim, H Ahn, J Bae, J Jin International Journal of Precision Engineering and Manufacturing 20, 463-477, 2019 | 74 | 2019 |
| Nanostructure-enhanced atomic line emission reply SC Kim, JH Jin, YJ Kim, IY Park, YS Kim, SW Kim Nature 485 (7397), E2-E3, 2012 | 70* | 2012 |
| Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser S Maeng, J Park, O Byungsun, J Jin Optics Express 20 (11), 12184-12190, 2012 | 65 | 2012 |
| Dimensional metrology using the optical comb of a mode-locked laser J Jin Measurement Science and Technology 27 (2), 022001, 2015 | 57 | 2015 |
| A wide-range optical frequency generator based on the frequency comb of a femtosecond laser YJ Kim, J Jin, Y Kim, S Hyun, SW Kim Optics express 16 (1), 258-264, 2008 | 52 | 2008 |
| Measurement of thickness profile and refractive index variation of a silicon wafer using the optical comb of a femtosecond pulse laser J Park, J Jin, JW Kim, JA Kim Optics Communications 305, 170-174, 2013 | 47 | 2013 |
| Absolute angle measurement using a phase-encoded binary graduated disk JA Kim, JW Kim, CS Kang, J Jin, TB Eom Measurement 80, 288-293, 2016 | 45 | 2016 |
| An optical absolute position measurement method using a phase-encoded single track binary code JA Kim, JW Kim, CS Kang, J Jin, T Bong Eom Review of Scientific Instruments 83 (11), 2012 | 45 | 2012 |
| Vibration-insensitive measurements of the thickness profile of large glass panels J Park, J Bae, J Jin, JA Kim, JW Kim Optics Express 23 (26), 32941-32949, 2015 | 38 | 2015 |
| Precision depth measurement of through silicon vias (TSVs) on 3D semiconductor packaging process J Jin, JW Kim, CS Kang, JA Kim, S Lee Optics express 20 (5), 5011-5016, 2012 | 38 | 2012 |
| Absolute distance measurements using the optical comb of a femtosecond pulse laser JH Jin, YJ Kim, YS Kim, SW Kim International Journal of precision engineering and manufacturing 8 (4), 22-26, 2007 | 33 | 2007 |
| Fizeau-type interferometric probe to measure geometrical thickness of silicon wafers J Jin, S Maeng, J Park, JA Kim, JW Kim Optics Express 22 (19), 23427-23432, 2014 | 31 | 2014 |
| Precision angle comparator using self-calibration of scale errors based on the equal-division-averaged method JA Kim, JW Kim, CS Kang, J Jin, TB Eom Proc. of MacroScale 2011, 2011 | 29 | 2011 |
| Absolute distance measurement method without a non-measurable range and directional ambiguity based on the spectral-domain interferometer using the optical comb of the … J Park, J Jin, JA Kim, JW Kim Applied Physics Letters 109 (24), 2016 | 28 | 2016 |
| Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb J Bae, J Park, H Ahn, J Jin Optics Express 25 (11), 12689-12697, 2017 | 27 | 2017 |
| Measurement of refractive index dispersion of a fused silica plate using Fabry–Perot interference C Lee, H Choi, J Jin, M Cha Applied Optics 55 (23), 6285-6291, 2016 | 21 | 2016 |
Jungjae ParkKorea Research Institute of Standards and ScienceVerified email at kriss.re.kr
