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Co-authors
- Dan Keun SungProfessor Emeritus, School of Electrical Engineering, Korea Adv. Inst. of Sci. & Tech(KAIST).Verified email at kaist.ac.kr
- Su Min KimProfessor, Department of Electronics Engineering, Tech University of Korea (TU Korea)Verified email at tukorea.ac.kr
- Bang Chul JungProfessor, Dept. of EE, Chungnam National Univ.Verified email at cnu.ac.kr
- Kabseok KoKangwon National UniversityVerified email at kangwon.ac.kr
- Seong Ho ChaeAssociate Professor, Tech University of KoreaVerified email at tukorea.ac.kr
- Han Seung JANGAssociate Professor, School of EEC, Chonnam National UniversityVerified email at jnu.ac.kr
- Min Suk KangKAISTVerified email at kaist.ac.kr
- Jun HanAssociate Professor, School of Computing, KAISTVerified email at kaist.ac.kr
- Jong Taek LeeKyungpook National UniversityVerified email at utexas.edu
- Jin-Taek LimStaff Engineer, Samsung ElectronicsVerified email at samsung.com
- Hoojin LeeProfessor, Department of Convergence Security, Hansung UniversityVerified email at hansung.ac.kr
- Taehoon KimAssociate Professor, Department of Computer Engineering, Hanbat National University (HBNU)Verified email at hanbat.ac.kr
- Eunmi ChuKorea Intellectual propoerty office (KIPO)
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