Kirill Mitrofanov
Kirill Mitrofanov
Verified email at oist.jp
Title
Cited by
Cited by
Year
Femtosecond structural transformation of phase-change materials far from equilibrium monitored by coherent phonons
M Hase, P Fons, K Mitrofanov, AV Kolobov, J Tominaga
Nature communications 6 (1), 1-6, 2015
492015
Selective detection of tetrahedral units in amorphous GeTe-based phase change alloys using Ge L3-edge x-ray absorption near-edge structure spectroscopy
M Krbal, AV Kolobov, P Fons, KV Mitrofanov, Y Tamenori, J Hegedüs, ...
Applied Physics Letters 102 (11), 111904, 2013
352013
Ge L3-edge x-ray absorption near-edge structure study of structural changes accompanying conductivity drift in the amorphous phase of Ge2Sb2Te5
KV Mitrofanov, AV Kolobov, P Fons, X Wang, J Tominaga, Y Tamenori, ...
Journal of Applied Physics 115 (17), 173501, 2014
312014
Origin of resistivity contrast in interfacial phase-change memory: The crucial role of Ge/Sb intermixing
Y Saito, AV Kolobov, P Fons, KV Mitrofanov, K Makino, J Tominaga, ...
Applied Physics Letters 114 (13), 132102, 2019
262019
A Magnetoresistance Induced by a Nonzero Berry Phase in GeTe/Sb2Te3 Chalcogenide Superlattices
J Tominaga, Y Saito, K Mitrofanov, N Inoue, P Fons, AV Kolobov, ...
Advanced Functional Materials 27 (40), 1702243, 2017
262017
Sub-nanometre resolution of atomic motion during electronic excitation in phase-change materials
KV Mitrofanov, P Fons, K Makino, R Terashima, T Shimada, AV Kolobov, ...
Scientific reports 6 (1), 1-9, 2016
262016
Local structure of the SnTe topological crystalline insulator: Rhombohedral distortions emerging from the rocksalt phase
KV Mitrofanov, AV Kolobov, P Fons, M Krbal, T Shintani, J Tominaga, ...
Physical Review B 90 (13), 134101, 2014
212014
Picosecond strain dynamics in monitored by time-resolved x-ray diffraction
P Fons, P Rodenbach, KV Mitrofanov, AV Kolobov, J Tominaga, ...
Physical Review B 90 (9), 094305, 2014
192014
Compositional tuning in sputter-grown highly-oriented Bi–Te films and their optical and electronic structures
Y Saito, P Fons, K Makino, KV Mitrofanov, F Uesugi, M Takeguchi, ...
Nanoscale 9 (39), 15115-15121, 2017
142017
High-quality sputter-grown layered chalcogenide films for phase change memory applications and beyond
Y Saito, P Fons, AV Kolobov, KV Mitrofanov, K Makino, J Tominaga, ...
Journal of Physics D: Applied Physics 53 (28), 284002, 2020
132020
Study of band inversion in the PbxSn1− xTe class of topological crystalline insulators using x-ray absorption spectroscopy
KV Mitrofanov, AV Kolobov, P Fons, M Krbal, J Tominaga, T Uruga
Journal of Physics: Condensed Matter 26 (47), 475502, 2014
112014
Local structure of the crystalline and amorphous states of phase-change alloy without resonant bonding: A combined x-ray absorption and ab initio study
AV Kolobov, P Fons, M Krbal, K Mitrofanov, J Tominaga, T Uruga
Physical Review B 95 (5), 054114, 2017
102017
High‐speed bipolar switching of sputtered Ge–Te/Sb–Te superlattice iPCM with enhanced cyclability
KV Mitrofanov, Y Saito, N Miyata, P Fons, AV Kolobov, J Tominaga
physica status solidi (RRL)–Rapid Research Letters 13 (8), 1900105, 2019
92019
Enhanced Sb2S3 crystallisation by electric field induced silver doping
W Dong, M Krbal, J Kalikka, XY Chin, B Gholipour, C Soci, PJ Fons, ...
Thin Solid Films 616, 80-85, 2016
92016
Resistive switching characteristics of interfacial phase-change memory at elevated temperature
KV Mitrofanov, Y Saito, N Miyata, P Fons, AV Kolobov, J Tominaga
Japanese Journal of Applied Physics 57 (4S), 04FE06, 2018
72018
Phase transitions in thin Ge 2 Sb 2 Te 5 chalcogenide films according to Raman spectroscopy data
AP Avachev, SP Vikhrov, NV Vishnyakov, SA Kozyukhin, KV Mitrofanov, ...
Semiconductors 46 (5), 591-594, 2012
62012
Chalcogenide van der Waals superlattices: a case example of interfacial phase-change memory
Y Saito, P Fons, KV Mitrofanov, K Makino, J Tominaga, J Robertson, ...
Pure and Applied Chemistry 91 (11), 1777-1786, 2019
52019
Detection of N-Te bonds in the as-deposited amorphous nitrogen-doped GeTe-based phase change alloys using N K-edge XANES spectroscopy and their impact on crystallization
M Krbal, AV Kolobov, P Fons, KV Mitrofanov, Y Tamenori, B Hyot, B Andre, ...
Journal of Alloys and Compounds 704, 254-259, 2017
52017
Sputter growth of chalcogenide superlattice films for future phase change memory applications
Y Saito, KV Mitrofanov, K Makino, N Miyata, P Fons, AV Kolobov, ...
ECS Transactions 86 (3), 49, 2018
42018
Hard-X-ray magnetic microscopy and local magnetization analysis using synchrotron radiation
M Suzuki
Microscopy 63 (suppl_1), i14-i14, 2014
42014
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