| Microscopic Modeling of HfOx RRAM Operations: From Forming to Switching A Padovani, L Larcher, O Pirrotta, L Vandelli, G Bersuker IEEE Transactions on electron devices 62 (6), 1998-2006, 2015 | 220 | 2015 |
| Experimental and theoretical study of electrode effects in HfO2 based RRAM C Cagli, J Buckley, V Jousseaume, T Cabout, A Salaun, H Grampeix, ... 2011 International Electron Devices Meeting, 28.7. 1-28.7. 4, 2011 | 108 | 2011 |
| Leakage current through the poly-crystalline HfO2: Trap densities at grains and grain boundaries O Pirrotta, L Larcher, M Lanza, A Padovani, M Porti, M Nafría, G Bersuker Journal of Applied Physics 114 (13), 2013 | 89 | 2013 |
| Controlling uniformity of RRAM characteristics through the forming process A Kalantarian, G Bersuker, DC Gilmer, D Veksler, B Butcher, A Padovani, ... 2012 IEEE International Reliability Physics Symposium (IRPS), 6C. 4.1-6C. 4.5, 2012 | 77 | 2012 |
| Microscopic understanding and modeling of HfO2 RRAM device physics L Larcher, A Padovani, O Pirrotta, L Vandelli, G Bersuker 2012 International Electron Devices Meeting, 20.1. 1-20.1. 4, 2012 | 61 | 2012 |
| A novel electronic nose as adaptable device to judge microbiological quality and safety in foodstuff V Sberveglieri, EN Carmona, E Comini, A Ponzoni, D Zappa, O Pirrotta, ... BioMed research international 2014, 2014 | 34 | 2014 |
| Temperature impact (up to 200 °C) on performance and reliability of HfO2-based RRAMs T Cabout, L Perniola, V Jousseaume, H Grampeix, JF Nodin, A Toffoli, ... 2013 5th IEEE International Memory Workshop, 116-119, 2013 | 26 | 2013 |
| Investigation of the role of electrodes on the retention performance of HfOx based RRAM cells by experiments, atomistic simulations and device physical modeling B Traoré, KH Xue, E Vianello, G Molas, P Blaise, B De Salvo, A Padovani, ... 2013 IEEE International Reliability Physics Symposium (IRPS), 5E. 2.1-5E. 2.6, 2013 | 21 | 2013 |
| Combined effects of LED lights and chicken manure on Neochloris oleoabundans growth M Altunoz, O Pirrotta, L Forti, G Allesina, S Pedrazzi, O Obali, P Tartarini, ... Bioresource technology 244, 1261-1268, 2017 | 20 | 2017 |
| Progresses in modeling HfOx RRAM operations and variability L Larcher, O Pirrotta, FM Puglisi, A Padovani, P Pavan, L Vandelli ECS Transactions 64 (14), 49, 2014 | 18 | 2014 |
| Interface Engineering of Ag--Based Conductive Bridge RAM for Reconfigurable Logic Applications G Palma, E Vianello, O Thomas, M Suri, S Onkaraiah, A Toffoli, ... IEEE Transactions on Electron Devices 61 (3), 793-800, 2014 | 18 | 2014 |
| Microscopic understanding and modeling of HfO L Larcher, A Padovani, O Pirrotta, L Vandelli, G Bersuker Proc. IEEE Int. Electron Devices Meeting (IEDM), 20.1, 0 | 6 | |
| Multi-scale modeling of oxygen vacancies assisted charge transport in sub-stoichiometric TiO x for RRAM application O Pirrotta, A Padovani, L Larcher, L Zhao, B Magyari-Köpe, Y Nishi Proc. Int. Conf. Simul. Semicond. Processes Devices, 37-40, 2014 | 5 | 2014 |
| IEDM C Cagli, J Buckley, V Jousseaume, T Cabout, A Salaun, H Grampeix, ... IEEE International 28, 1-28.7, 0 | 5 | |
| Modellizzazione microscopica e simulazione di dielettrici ad alta costante dielettrica per dispositivi logici e di memoria innovativi O PIRROTTA | | 2015 |
| Modeling the charge transport and degradation in HfO2 dielectric for reliability improvement and life-time predictions in logic and memory devices A Padovani, L Larcher, L Vandelli, O Pirrotta, P Pavan 2011 International Semiconductor Device Research Symposium (ISDRS), 1-2, 2011 | | 2011 |
