| NV-Heaps: making persistent objects fast and safe with next-generation, non-volatile memories J Coburn, AM Caulfield, A Akel, LM Grupp, RK Gupta, R Jhala, ... Proceedings of the sixteenth international conference on Architectural …, 2011 | 987 | 2011 |
| Characterizing flash memory: Anomalies, observations, and applications LM Grupp, AM Caulfield, J Coburn, S Swanson, E Yaakobi, PH Siegel, ... Proceedings of the 42nd Annual IEEE/ACM International Symposium on …, 2009 | 573 | 2009 |
| The Bleak Future of NAND Flash Memory LM Grupp, JD Davis, S Swanson | 417* | |
| Gordon: using flash memory to build fast, power-efficient clusters for data-intensive applications AM Caulfield, LM Grupp, S Swanson ACM Sigplan Notices 44 (3), 217-228, 2009 | 367 | 2009 |
| Reliably erasing data from flash-based solid state drives M Wei, LM Grupp, FE Spada, S Swanson 9th USENIX Conference on File and Storage Technologies, San Jose, CA, USA …, 2011 | 285 | 2011 |
| Error characterization and coding schemes for flash memories E Yaakobi, J Ma, L Grupp, PH Siegel, S Swanson, JK Wolf 2010 IEEE Globecom Workshops, 1856-1860, 2010 | 121 | 2010 |
| Extracting Device Fingerprints from Flash Memory by Exploiting Physical Variations P Prabhu, A Akel, L Grupp, WK Yu, G Suh, E Kan, S Swanson Trust and Trustworthy Computing, 188-201, 2011 | 120 | 2011 |
| Characterization and error-correcting codes for TLC flash memories E Yaakobi, L Grupp, PH Siegel, S Swanson, JK Wolf 2012 international conference on computing, networking and communications …, 2012 | 91 | 2012 |
| Understanding the impact of power loss on flash memory HW Tseng, L Grupp, S Swanson Proceedings of the 48th Design Automation Conference, 35-40, 2011 | 83 | 2011 |
| The Harey Tortoise: Managing Heterogeneous Write Performance in {SSDs} LM Grupp, JD Davis, S Swanson 2013 USENIX Annual Technical Conference (USENIX ATC 13), 79-90, 2013 | 67 | 2013 |
| Modeling Power Consumption of NAND Flash Memories Using FlashPower V Mohan, T Bunker, L Grupp, S Gurumurthi, MR Stan, S Swanson Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 2013 | 54 | 2013 |
| Tackling intracell variability in TLC flash through tensor product codes R Gabrys, E Yaakobi, L Grupp, S Swanson, L Dolecek 2012 IEEE International Symposium on Information Theory Proceedings, 1000-1004, 2012 | 23 | 2012 |
| Error correcting coding for flash memories E Yaakobi, J Ma, A Caulfield, L Grupp, S Swanson, PH Siegel, JK Wolf Flash Memory Summit 31, 4-10, 2009 | 20 | 2009 |
| Underpowering NAND flash: Profits and perils HW Tseng, LM Grupp, S Swanson Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013 | 19 | 2013 |
| Gordon: An improved architecture for data-intensive applications AM Caulfield, LM Grupp, S Swanson Micro, IEEE 30 (1), 121-130, 2010 | 17 | 2010 |
| Beyond the datasheet: Using test beds to probe non-volatile memories' dark secrets LM Grupp, AM Caulfield, J Coburn, JD Davis, S Swanson 2010 IEEE Globecom Workshops, 1930-1935, 2010 | 7 | 2010 |
| NVTM: A transactional interface for next-generation non-volatile memories J Coburn, A Caulfield, L Grupp, A Adel, S Swanson | 5 | 2009 |
| Error-Correcting Codes for TLC Flash E Yaakobi, L Grupp, S Swanson, PH Siegel, JK Wolf Flash Memory Summit, 2011 | 4 | 2011 |
| Efficient Coding Schemes for Flash Memories E Yaakobi, L Grupp, S Swanson, PH Siegel, JK Wolf Flash Memory Summit, 142, 2010 | 4 | 2010 |
| Implications of New Storage Technology LM Grupp, JD Davis | | 2012 |
Steven SwansonUniversity of California, San DiegoVerified email at eng.ucsd.edu
