prof. Andrea Irace

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Giovanni BreglioUniversità di Napoli Federico IIVerified email at unina.it
Riccio MicheleUniversity of Naples Federico II - Department of Electrical Engineering and Information technologiesVerified email at unina.it
Luca MarescaUniversity of Naples Federico II - Department of Electrical Engineering and Information technologiesVerified email at unina.it
Gianpaolo Romano, PhDPrincipal R&D Engineer, StarPower Europe, SwitzerlandVerified email at starpowereurope.com
Vincenzo d'AlessandroFull Professor of Electronics, DIETI, University Federico II, Naples, ItalyVerified email at unina.it
Mario IodiceISASI - CNRVerified email at cnr.it
Giuseppe CoppolaInstitute of Applied Science and Intelligent SystemsVerified email at cnr.it
Giuseppe De FalcoPh.D., University of Naples "Federico II"- DIETIVerified email at unina.it
Daliento SantoloProfessore di Dispositivi e Sistemi Fotovoltaici, Università di NapoliVerified email at unina.it
P.M. (Lina) SarroDelft University of Technology, The NetherlandsVerified email at tudelft.nl
ettore napoliUniversity of SalernoVerified email at unina.it
michele giordanoResearcher Institute Polymers Composites and Biomaterials CNRVerified email at cnr.it
Lorenzo CodecasaProfessor of Electric Engineering, Politecnico di MilanoVerified email at polimi.it
Antonio Pio CatalanoAssistant Professor in Electronic Engineering for University of Naples Federico IIVerified email at unina.it
Alessandro MagnaniSemi ZabalaVerified email at semizabala.com
Nicholas WrightProfessor of Electronic Materials, Newcastle UniversityVerified email at ncl.ac.uk
Paolo MironeUniversity of Naples "Federico II"Verified email at unina.it
Salvatore StranoRicercatore, Dipartimento di Ingegneria Industriale, Università degli Studi di Napoli Federico IIVerified email at unina.it
Helmut KöckInfineon TechnologiesVerified email at infineon.com
Stefania CampopianoProfessor of ElectronicsVerified email at uniparthenope.it

prof. Andrea Irace

University of Naples Federico II

Verified email at unina.it

SiC power semiconductor devices optoelectronic devices Wide Bandgap Materials Wide Bandgap Devices


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A comprehensive study of short-circuit ruggedness of silicon carbide power MOSFETs G Romano, A Fayyaz, M Riccio, L Maresca, G Breglio, A Castellazzi, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 4 (3), 978-987, 2016	259	2016
SiC power MOSFETs performance, robustness and technology maturity A Castellazzi, A Fayyaz, G Romano, L Yang, M Riccio, A Irace Microelectronics Reliability 58, 164-176, 2016	136	2016
All-silicon optical temperature sensor based on Multi-Mode Interference A Irace, G Breglio Optics express 11 (22), 2807-2812, 2003	114	2003
Short-circuit failure mechanism of SiC power MOSFETs G Romano, L Maresca, M Riccio, V d'Alessandro, G Breglio, A Irace, ... 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's …, 2015	101	2015
An electrically controlled Bragg reflector integrated in a rib silicon on insulator waveguide A Cutolo, M Iodice, A Irace, P Spirito, L Zeni Applied physics letters 71 (2), 199-201, 1997	101	1997
Circuit-based electrothermal simulation of power devices by an ultrafast nonlinear MOR approach L Codecasa, V d’Alessandro, A Magnani, A Irace IEEE Transactions on Power Electronics 31 (8), 5906-5916, 2015	80	2015
Short-circuit robustness of SiC power MOSFETs: Experimental analysis A Castellazzi, A Fayyaz, L Yang, M Riccio, A Irace 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014	80	2014
Experimental detection and numerical validation of different failure mechanisms in IGBTs during unclamped inductive switching G Breglio, A Irace, E Napoli, M Riccio, P Spirito IEEE Transactions on Electron Devices 60 (2), 563-570, 2012	78	2012
A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulations M Riccio, V d'Alessandro, G Romano, L Maresca, G Breglio, A Irace IEEE Transactions on power electronics 33 (9), 8020-8029, 2017	77	2017
Experimental analysis of electro-thermal instability in SiC Power MOSFETs M Riccio, A Castellazzi, G De Falco, A Irace Microelectronics Reliability 53 (9-11), 1739-1744, 2013	67	2013
Fiber optic humidity sensors for high-energy physics applications at CERN M Consales, A Buosciolo, A Cutolo, G Breglio, A Irace, S Buontempo, ... Sensors and Actuators B: Chemical 159 (1), 66-74, 2011	66	2011
Measurement of thermal conductivity and diffusivity of single and multilayer membranes A Irace, PM Sarro Sensors and Actuators A: Physical 76 (1-3), 323-328, 1999	65	1999
UIS failure mechanism of SiC power MOSFETs A Fayyaz, A Castellazzi, G Romano, M Riccio, A Irace, J Urresti, N Wright 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2016	60	2016
All-silicon optoelectronic modulator with 1 GHz switching capability A Irace, G Breglio, A Cutolo Electronics Letters 39 (2), 1, 2003	58	2003
Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs A Borghese, M Riccio, A Fayyaz, A Castellazzi, L Maresca, G Breglio, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019	53	2019
SPICE modeling and dynamic electrothermal simulation of SiC power MOSFETs V d'Alessandro, A Magnani, M Riccio, G Breglio, A Irace, N Rinaldi, ... 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014	52	2014
A comprehensive study on the avalanche breakdown robustness of silicon carbide power MOSFETs A Fayyaz, G Romano, J Urresti, M Riccio, A Castellazzi, A Irace, N Wright Energies 10 (4), 452, 2017	49	2017
Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs A Fayyaz, L Yang, M Riccio, A Castellazzi, A Irace Microelectronics Reliability 54 (9-10), 2185-2190, 2014	45	2014
Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: Experiments and simulations M Riccio, A Irace, G Breglio, P Spirito, E Napoli, Y Mizuno 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and …, 2011	45	2011
Optical measurement techniques of recombination lifetime based on the free carriers absorption effect M De Laurentis, A Irace Journal of solid state physics 2014 (1), 291469, 2014	44	2014

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