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Co-authors
Robert SchoberFriedrich-Alexander-University Erlangen-NurembergVerified email at fau.de
Subbarayan PasupathyProfessor, Electrical and Computer Engineering, University of TorontoVerified email at comm.utoronto.ca
Dongbo ZhangQualcomm, Inc.Verified email at qti.qualcomm.com
Teng Joon LimUniversity of SydneyVerified email at sydney.edu.au
Zhengdao WangProfessor of Electrical and Computer Engineering, Iowa State UniversityVerified email at iastate.edu
Dong In KimDirector of ERC, Sungkyunkwan University (SKKU)Verified email at skku.ac.kr
Zhiqiang WuProfessor of Electrical Engineering, Wright State UniversityVerified email at wright.edu
Susanna MoslehNISTVerified email at colorado.edu
Khaled B. LetaiefNew Bright Professor of Engineering and Chair Professor, HKUSTVerified email at ust.hk
Xiaodai DongUniversity of VictoriaVerified email at ece.uvic.ca
Hong-Chuan YangProfessor of Electrical Engineering, University of VictoriaVerified email at uvic.ca
Xuemin (Sherman) ShenUniversity Professor, University of WaterlooVerified email at uwaterloo.ca
Prof. Mohamed-Slim AlouiniWireless CT Lab, King Abdullah University of Science and Technology (KAUST), Kingdom of Saudi ArabiaVerified email at kaust.edu.sa
Yi QianUniversity of Nebraska-LincolnVerified email at unl.edu

Yao Ma
CTL, National Institute of Standards and Technology
Verified email at ieee.org