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Massimo AliotoNational University of SingaporeVerified email at ieee.org
Saurabh JainResearch Scientist, Intel LabsVerified email at intel.com
Felice CrupiDIMES, Università della CalabriaVerified email at unical.it
Raffaele De RoseAssistant Professor, University of CalabriaVerified email at dimes.unical.it
Luigi FassioNational University of SingaporeVerified email at nus.edu.sg
Jerald YooNational University of SingaporeVerified email at nus.edu.sg
Marco LanuzzaUniversity of CalabriaVerified email at deis.unical.it
Yilong DONGNational University of SingaporeVerified email at u.nus.edu
Jiamin LiNational University of SingaporeVerified email at u.nus.edu
Jeong Hoan ParkStaff Engineer, Samsung ElectronicsVerified email at samsung.com
Tao TangZhejiang LabVerified email at zhejianglab.com
Yida LiSouthern University of Science and Technology, Shenzhen, ChinaVerified email at sustech.edu.cn
Lian ZhangNational University of SingaporeVerified email at u.nus.edu
Han WuPh.D. of Electrical and Computer Engineering, National University of SingaporeVerified email at nus.edu.sg
Feichi zhouSouthern University of Science and TechnologyVerified email at sustech.edu.cn
Ng Kian AnnSingaporeVerified email at ieee.org
Qiang FangPhD candidate, National University of SingaporeVerified email at u.nus.edu
Hui ZhangNational University of SingaporeVerified email at u.nus.edu
Karim Ali AhmedNational University of SingaporeVerified email at u.nus.edu
Paolo S. CrovettiAssociate Professor, Politecnico di TorinoVerified email at polito.it
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Longyang Lin
Assistant Professor, Southern University of Science and Technology
Verified email at sustech.edu.cn