| Hybrid K-Means Clustering and Support Vector Machine Method for Via and Metal Line Detections in Delayered IC Images D Cheng, Y Shi, T Lin, BH Gwee, KA Toh IEEE Transactions on Circuits and Systems II: Express Briefs 65 (12), 1849-1853, 2018 | 33 | 2018 |
| Deep Learning for Automatic IC Image Analysis X Hong, D Cheng, Y Shi, T Lin, BH Gwee 2018 IEEE 23rd International Conference on Digital Signal Processing (DSP), 1-5, 2018 | 31 | 2018 |
| Deep learning-based image analysis framework for hardware assurance of digital integrated circuits T Lin, Y Shi, N Shu, D Cheng, X Hong, J Song, BH Gwee Microelectronics Reliability 123, 114196, 2021 | 24 | 2021 |
| A Hierarchical Multi-Classifier System for Automated Analysis of Delayered IC Images D Cheng, Y Shi, BH Gwee, KA Toh, T Lin IEEE Intelligent Systems 34 (2), 36-43, 2018 | 22 | 2018 |
| Global Template Projection and Matching Method for Training-Free Analysis of Delayered IC Images D Cheng, Y Shi, T Lin, BH Gwee, KA Toh 2019 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2019 | 17 | 2019 |
| Delayered IC Image Analysis with Template‐based Tanimoto Convolution and Morphological Decision D Cheng, Y Shi, T Lin, BH Gwee, KA Toh IET Circuits, Devices & Systems 16 (2), 169-177, 2022 | 6 | 2022 |
| Joint Anomaly Detection and Inpainting for Microscopy Images via Deep Self-supervised Learning L Huang, D Cheng, X Yang, T Lin, Y Shi, K Yang, BH Gwee, B Wen 2021 IEEE International Conference on Image Processing (ICIP), 3497-3501, 2021 | 4 | 2021 |
| Patch-based adversarial training for error-aware circuit annotation of delayered ic images YY Tee, X Hong, D Cheng, CS Chee, Y Shi, T Lin, BH Gwee IEEE Transactions on Circuits and Systems II: Express Briefs, 2023 | 2 | 2023 |
| Unsupervised Graph-based Image Clustering for Pretext Distribution Learning in IC Assurance YY Tee, X Hong, D Cheng, T Lin, Y Shi, BH Gwee Microelectronics Reliability 148, 115160, 2023 | 1 | 2023 |
| Unsupervised Domain Adaptation with Histogram-gated Image Translation for Delayered IC Image Analysis YY Tee, D Cheng, CS Chee, T Lin, Y Shi, BH Gwee 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-7, 2022 | 1 | 2022 |
| Semantic-masked intensity augmentation for deep learning-based analysis of fpga images D Cheng, YY Tee, J Song, Y Shi, T Lin, BH Gwee 2022 IEEE International Symposium on the Physical and Failure Analysis of …, 2022 | 1 | 2022 |
| Hybrid unsupervised clustering for pretext distribution learning in ic image analysis YY Tee, X Hong, D Cheng, T Lin, Y Shi, BH Gwee 2022 IEEE International Symposium on the Physical and Failure Analysis of …, 2022 | 1 | 2022 |
| Integrated Circuit Mask-GAN for Circuit Annotation with Targeted Data Augmentation YY Tee, D Cheng, Y Shi, T Lin, BH Gwee IEEE Intelligent Systems, 2023 | | 2023 |
| A Strategic Framework for Evaluating Data Augmentation in Microscopic IC Image Analysis YY Tee, CS Chee, D Cheng, X Hong, Y Shi, BH Gwee 2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023 | | 2023 |
| GoCLIP: Graph one-class CLassification for Intellectual Property Circuit Identification X Hong, YY Tee, T Lin, Y Shi, D Cheng, E Huang, BH Gwee 2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023 | | 2023 |
| Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards D Cheng, Y Shi, YY Tee, J Song, X Wang, B Wen, BH Gwee 2023 IEEE 5th International Conference on Artificial Intelligence Circuits …, 2023 | | 2023 |
| Domain-Integrated Machine Learning for IC Image Analysis D Cheng, Y Shi, T Lin, BH Gwee Fusion of Machine Learning Paradigms: Theory and Applications, 129-151, 2023 | | 2023 |
| Deep Learning-Based Image Analysis Framework for Hardware Assurance of Digital Integrated Circuits T Lin, Y Shi, N Shu, D Cheng, X Hong, J Song, BH Gwee 2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020 | | 2020 |
Bah Hwee GweeNanyang Technological universityVerified email at ntu.edu.sg
