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Co-authors
- Shengbing JiangGeneral Motors Global R&DVerified email at gm.com
- Hao YingIEEE Fellow and Professor, Department of Electrical and Computer Engineering, Wayne State UniversityVerified email at wayne.edu
- Chaitanya SankavaramStaff Researcher, General MotorsVerified email at gm.com
- Yan ChenArizona State UniversityVerified email at asu.edu
- Feng LinProfessor of Electrical and Computer Engineering, Wayne State UniversityVerified email at ece.eng.wayne.edu
- Paul Krajewski, P Krajewski, P.E. Kraj...General MotorsVerified email at gm.com
- Junbo SonAlfred Lerner College of Business & Economics, University of DelawareVerified email at udel.edu
- Dirk Uwe SauerRWTH Aachen University / Forschungszentrum JülichVerified email at isea.rwth-aachen.de
- Gregory AunerWayne State University, Henry Ford Hospital Systems, Karmanos Cancer Institute, and MedicalVerified email at medicalep.com