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Co-authors
- Hlaing MinnProfessor of Electrical Engineering, University of Texas at DallasVerified email at utdallas.edu
- Ahmed S. IbrahimAssociate Professor, Florida International UniversityVerified email at fiu.edu
- Yucheng DaiQualcomm IncorporatedVerified email at qti.qualcomm.com
- Mohamed M KhairyProf. of Telecommunications, Cairo University Verified email at eng.cu.edu.eg
- Mahmoud H. Ismail, PhD, SM'IEEEProfessor of Electrical Engineering at Cairo University and American University of SharjahVerified email at aus.edu
- Fabiano S RodriguesThe University of Texas at Dallas - UTDVerified email at utdallas.edu
- Jin LiuUniversity of Texas at Dallas Verified email at utdallas.edu
- Alan GathererCirrus360Verified email at ieee.org
- Jiu XiongUNIVERSITY OF TEXAS AT DALLASVerified email at utdallas.edu
- Belal S. A. KoranyQualcomm Wireless R&DVerified email at qti.qualcomm.com