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Tihomir Knezevic
Tihomir Knezevic
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Year
Boron-layer silicon photodiodes for high-efficiency low-energy electron detection
A Šakić, LK Nanver, TLM Scholtes, CTH Heerkens, T Knežević, ...
Solid-state electronics 65, 38-44, 2011
542011
Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection
A S̆akić, LK Nanver, G Van Veen, K Kooijman, P Vogelsang, ...
2010 International Electron Devices Meeting, 31.4. 1-31.4. 4, 2010
422010
Limits on thinning of boron layers with/without metal contacting in PureB Si (photo) diodes
T Knežević, X Liu, E Hardeveld, T Suligoj, LK Nanver
IEEE electron device letters 40 (6), 858-861, 2019
252019
M-center in low-energy electron irradiated 4H-SiC
T Knežević, A Hadžipašić, T Ohshima, T Makino, I Capan
Applied physics letters 120 (25), 2022
122022
Nanometer-thin pure boron CVD layers as material barrier to Au or Cu metallization of Si
DT Shivakumar, T Knežević, LK Nanver
Journal of Materials Science: Materials in Electronics 32 (6), 7123-7135, 2021
122021
Modelling of electrical characteristics of ultrashallow pure amorphous boron p+n junctions
T Knežević, T Suligoj, A Šakić, LK Nanver
2012 Proceedings of the 35th International Convention MIPRO, 36-41, 2012
112012
Series resistance optimization of high-sensitivity Si-based VUV photodiodes
L Shi, LK Nanver, A Šakić, S Nihtianov, T Knežević, A Gottwald, U Kroth
2011 IEEE International Instrumentation and Measurement Technology …, 2011
102011
Examination of the InP/InGaAs single-photon avalanche diodes by establishing a new TCAD-based simulation environment
T Knežević, T Suligoj
2016 International Conference on Simulation of Semiconductor Processes and …, 2016
92016
Design of passive-quenching active-reset circuit with adjustable hold-off time for single-photon avalanche diodes
I Berdalović, Ž Osrečki, F Šegmanović, D Grubišić, T Knežević, T Suligoj
2016 39th International Convention on Information and Communication …, 2016
92016
2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)
M Krakers, T Kneevic, LK Nanver
IEEE, 2019
82019
Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon
LK Nanver, X Liu, T Knezevic
2018 IEEE International Conference on Microelectronic Test Structures (ICMTS …, 2018
82018
2D dark-count-rate modeling of PureB single-photon avalanche diodes in a TCAD environment
T Knežević, LK Nanver, T Suligoj
Physics and Simulation of Optoelectronic Devices XXVI 10526, 266-275, 2018
82018
Solid-state backscattered-electron detector for sub-keV imaging in scanning electron microscopy
A Šakić, LK Nanver, G Van Veen, K Kooijman, P Vogelsang, ...
82011
Broadband PureGaB Ge-on-Si photodiodes responsive in the ultraviolet to near-infrared range
T Knežević, M Krakers, LK Nanver
Optical Components and Materials XVII 11276, 73-85, 2020
72020
Silicon drift detectors with the drift field induced by PureB-coated trenches
T Knežević, LK Nanver, T Suligoj
Photonics 3 (4), 54, 2016
72016
PureB diode fabrication using physical or chemical vapor deposition methods for increased back-end-of-line accessibility
SD Thammaiah, X Liu, T Knežević, KM Batenburg, AAI Aarnink, ...
Solid-state electronics 177, 107938, 2021
62021
Distinguishing the EH1 and S1 defects in n-type 4H-SiC by Laplace DLTS
T Knežević, T Brodar, V Radulović, L Snoj, T Makino, I Capan
Applied Physics Express 15 (10), 101002, 2022
52022
Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment
T Knežević, LK Nanver, T Suligoj
Physics and Simulation of Optoelectronic Devices XXVII 10912, 101-108, 2019
52019
Reverse breakdown and light-emission patterns studied in Si PureB SPADs
M Krakers, T Kneevic, LK Nanver
2019 42nd International Convention on Information and Communication …, 2019
42019
Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers
T Knežević, T Suligoj, LK Nanver
2019 42nd International Convention on Information and Communication …, 2019
42019
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