Root cause prediction based on bug reports T Hirsch, B Hofer 2020 IEEE International Symposium on Software Reliability Engineering …, 2020 | 14 | 2020 |
A systematic literature review on benchmarks for evaluating debugging approaches T Hirsch, B Hofer Journal of Systems and Software 192, 111423, 2022 | 10 | 2022 |
What we can learn from how programmers debug their code T Hirsch, B Hofer 2021 IEEE/ACM 8th International Workshop on Software Engineering Research …, 2021 | 10 | 2021 |
Using textual bug reports to predict the fault category of software bugs T Hirsch, B Hofer Array 15, 100189, 2022 | 7 | 2022 |
Identifying non-natural language artifacts in bug reports T Hirsch, B Hofer 2021 36th IEEE/ACM International Conference on Automated Software …, 2021 | 4 | 2021 |
Detecting non-natural language artifacts for de-noising bug reports T Hirsch, B Hofer Automated Software Engineering 29 (2), 52, 2022 | 3 | 2022 |
An approach to test classification in big android applications T Hirsch, C Schindler, M Müller, T Schranz, W Slany 2019 IEEE 19th International Conference on Software Quality, Reliability and …, 2019 | 3 | 2019 |
A Fault Localization and Debugging Support Framework driven by Bug Tracking Data T Hirsch 2020 IEEE International Symposium on Software Reliability Engineering …, 2020 | 2 | 2020 |
Pruning Boolean Expressions to Shorten Dynamic Slices T Hirsch, B Hofer 2022 IEEE 22nd International Working Conference on Source Code Analysis and …, 2022 | 1 | 2022 |
Generalizable Temperature Nowcasting with Physics-Constrained RNNs for Predictive Maintenance of Wind Turbine Components J Exenberger, M Di Salvo, T Hirsch, F Wotawa, G Schweiger arXiv preprint arXiv:2404.04126, 2024 | | 2024 |
Reducing the Length of Dynamic and Relevant Slices by Pruning Boolean Expressions T Hirsch, B Hofer Electronics 13 (6), 1146, 2024 | | 2024 |
Predictive Reranking using Code Smells for Information Retrieval Fault Localization T Hirsch, B Hofer 2024 IEEE 22nd World Symposium on Applied Machine Intelligence and …, 2024 | | 2024 |
The MAP Metric in Information Retrieval Fault Localization T Hirsch, B Hofer 2023 38th IEEE/ACM International Conference on Automated Software …, 2023 | | 2023 |
Analysing Residual Risks when Introducing Monitoring and Diagnosis into Systems T Hirsch, F Wotawa 2023 10th International Conference on Dependable Systems and Their …, 2023 | | 2023 |
An Open IoT Platform: Lessons Learned from a District Energy System T Schranz, Q Alfalouji, T Hirsch, G Schweiger 2022 Second International Conference on Sustainable Mobility Applications …, 2022 | | 2022 |
2021 36th IEEE/ACM International Conference on Automated Software Engineering Workshops (ASEW)| 978-1-6654-3583-3/21/$31.00© 2021 IEEE| DOI: 10.1109/ASEW52652. 2021.00060 R Abreu, G Alavani, H Aljamaan, W Aljedaani, K Allix, M Almeida Maia, ... | | |
SCAM 2022 T Hirsch, B Hofer, S Schott, F Pauck, H Inayoshi, S Kakei, M Abdi, ... | | |
2022 IEEE 22nd International Working Conference on Source Code Analysis and Manipulation (SCAM)| 978-1-6654-9609-4/22/$31.00© 2022 IEEE| DOI: 10.1109/SCAM55253. 2022.00039 M Abdi, BV Adjibi, K Allix, G Antal, D Atzberger, G Balogh, I Baráth, ... | | |