| Technology roadmap for flexible sensors Y Luo, MR Abidian, JH Ahn, D Akinwande, AM Andrews, M Antonietti, ... ACS nano 17 (6), 5211-5295, 2023 | 278 | 2023 |
| A wireless multi-channel capacitive sensor system for efficient glove-based gesture recognition with AI at the edge J Pan, Y Luo, Y Li, CK Tham, CH Heng, AVY Thean IEEE Transactions on Circuits and Systems II: Express Briefs 67 (9), 1624-1628, 2020 | 45 | 2020 |
| Hybrid-flexible bimodal sensing wearable glove system for complex hand gesture recognition J Pan, Y Li, Y Luo, X Zhang, X Wang, DLT Wong, CH Heng, CK Tham, ... ACS sensors 6 (11), 4156-4166, 2021 | 30 | 2021 |
| A soft polydimethylsiloxane liquid metal interdigitated capacitor sensor and its integration in a flexible hybrid system for on-body respiratory sensing Y Li, S Nayak, Y Luo, Y Liu, HK Salila Vijayalal Mohan, J Pan, Z Liu, ... Materials 12 (9), 1458, 2019 | 30 | 2019 |
| Transfer learning-based artificial intelligence-integrated physical modeling to enable failure analysis for 3 nanometer and smaller silicon-based CMOS transistors J Pan, KL Low, J Ghosh, S Jayavelu, MM Ferdaus, SY Lim, E Zamburg, ... ACS Applied Nano Materials 4 (7), 6903-6915, 2021 | 25 | 2021 |
| Reconfigurable nonlinear photonic activation function for photonic neural network based on non-volatile opto-resistive RAM switch Z Xu, B Tang, X Zhang, JF Leong, J Pan, S Hooda, E Zamburg, ... Light: Science & Applications 11 (1), 288, 2022 | 15 | 2022 |
| Stress-memorized HZO for high-performance ferroelectric field-effect memtransistor SH Tsai, Z Fang, X Wang, U Chand, CK Chen, S Hooda, M Sivan, J Pan, ... ACS Applied Electronic Materials 4 (4), 1642-1650, 2022 | 15 | 2022 |
| Physical insights into vacancy-based memtransistors: toward power efficiency, reliable operation, and scalability M Sivan, JF Leong, J Ghosh, B Tang, J Pan, E Zamburg, AVY Thean ACS nano 16 (9), 14308-14322, 2022 | 9 | 2022 |
| First Demonstration of Ultra-low Dit Top-Gated Ferroelectric Oxide-Semiconductor Memtransistor with Record Performance by Channel Defect Self-Compensation … CK Chen, Z Fang, S Hooda, M Lal, U Chand, Z Xu, J Pan, SH Tsai, ... 2022 International Electron Devices Meeting (IEDM), 6.1. 1-6.1. 4, 2022 | 7 | 2022 |
| Significance of activation functions in developing an online classifier for semiconductor defect detection MM Ferdaus, B Zhou, JW Yoon, KL Low, J Pan, J Ghosh, M Wu, X Li, ... Knowledge-Based Systems 248, 108818, 2022 | 7 | 2022 |
| N‐P Reconfigurable Dual‐Mode Memtransistors for Compact Bio‐Inspired Feature Extractor with Inhibitory‐Excitatory Spiking Capability JF Leong, Z Fang, M Sivan, J Pan, B Tang, E Zamburg, AVY Thean Advanced Functional Materials 33 (45), 2302949, 2023 | 4 | 2023 |
| Low-thermal-budget beol-compatible beyond-silicon transistor technologies for future monolithic-3d compute and memory applications A Thean, SH Tsai, CK Chen, M Sivan, B Tang, S Hooda, Z Fang, J Pan, ... 2022 International Electron Devices Meeting (IEDM), 12.2. 1-12.2. 4, 2022 | 3 | 2022 |
| Seal Integrity Testing Utilizing Non-Destructive Capacitive Sensing for Product Packaging Assurance J Pan, Y Li, Y Luo, XY Zhang, Z Yang, DLT Wong, X Niu, CK Tham, ... 2020 IEEE SENSORS, 1-4, 2020 | 3 | 2020 |
| High-Performance Top-Gated and Double-Gated Oxide–Semiconductor Ferroelectric Field-Effect Transistor Enabled by Channel Defect Self-Compensation Effect CK Chen, S Hooda, Z Fang, M Lal, Z Xu, J Pan, SH Tsai, E Zamburg, ... IEEE Transactions on Electron Devices 70 (4), 2098-2105, 2023 | 2 | 2023 |
| Non-destructive online seal integrity inspection utilizing autoencoder-based electrical capacitance tomography for product packaging assurance J Pan, Z Yang, SHK Yap, X Zhang, Z Xu, Y Li, Y Luo, E Zamburg, EX Liu, ... Food Packaging and Shelf Life 33, 100919, 2022 | 1 | 2022 |
| Engineered Nucleotide Chemicapacitive Microsensor Array Augmented with Physics‐Guided Machine Learning for High‐Throughput Screening of Cannabidiol SHK Yap, J Pan, DV Linh, X Zhang, X Wang, WZ Teo, E Zamburg, ... Small 18 (22), 2107659, 2022 | 1 | 2022 |
| Negative-U Defect Passivation in Oxide-Semiconductor by Channel Defect Self-Compensation Effect to Achieve Low Bias Stress VTH Instability of Low-Thermal … CK Chen, Z Xu, S Hooda, J Pan, E Zamburg, AVY Thean 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
| Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor T Shih-Hao, F Zihang, W XINGHUA, U CHAND, CK Chen, S DEVI, ... | | 2022 |
