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Andrei Benediktovitch
Andrei Benediktovitch
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Cited by
Year
Theoretical Concepts of X-ray Nanoscale Analysis
A Benediktovich, I Feranchuk, A Ulyanenkov
Springer Series in Materials Science 183, 265-272, 2014
662014
Population inversion X-ray laser oscillator
A Halavanau, A Benediktovitch, AA Lutman, D DePonte, D Cocco, ...
Proceedings of the National Academy of Sciences 117 (27), 15511-15516, 2020
452020
Evidence of extreme ultraviolet superfluorescence in xenon
L Mercadier, A Benediktovitch, C Weninger, MA Blessenohl, S Bernitt, ...
Physical review letters 123 (2), 023201, 2019
312019
Observation of Seeded Mn Stimulated X-Ray Emission Using Two-Color X-Ray Free-Electron Laser Pulses
T Kroll, C Weninger, FD Fuller, MW Guetg, A Benediktovitch, Y Zhang, ...
Physical review letters 125 (3), 037404, 2020
292020
Quantum theory of superfluorescence based on two-point correlation functions
A Benediktovitch, VP Majety, N Rohringer
Physical Review A 99 (1), 013839, 2019
272019
High-resolution x-ray diffraction investigation of relaxation and dislocations in SiGe layers grown on (001),(011), and (111) Si substrates
A Zhylik, A Benediktovich, A Ulyanenkov, H Guerault, M Myronov, ...
Journal of applied physics 109 (12), 2011
262011
Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffraction
A Mikhalychev, A Benediktovitch, T Ulyanenkova, A Ulyanenkov
Journal of applied crystallography 48 (3), 679-689, 2015
182015
Characterization of dislocations in germanium layers grown on (011)-and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction
A Benediktovitch, A Zhylik, T Ulyanenkova, M Myronov, A Ulyanenkov
Journal of applied crystallography 48 (3), 655-665, 2015
132015
Concentration and relaxation depth profiles of InGaAs/GaAs and GaAsP/GaAs graded epitaxial films studied by x-ray diffraction
A Benediktovitch, A Ulyanenkov, F Rinaldi, K Saito, VM Kaganer
Physical Review B 84 (3), 035302, 2011
132011
Bunches of misfit dislocations on the onset of relaxation of Si0. 4Ge0. 6/Si (001) epitaxial films revealed by high-resolution x-ray diffraction
V Kaganer, T Ulyanenkova, A Benediktovitch, M Myronov, A Ulyanenkov
Journal of Applied Physics 122 (10), 2017
122017
Stress gradient analysis by noncomplanar X-ray diffraction and corresponding refraction correction
A Benediktovitch, T Ulyanenkova, J Keckes, A Ulyanenkov
Advanced Materials Research 996, 162-168, 2014
122014
Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
A Zhylik, A Benediktovitch, I Feranchuk, K Inaba, A Mikhalychev, ...
Journal of Applied Crystallography 46 (4), 919-925, 2013
112013
Generation of intense phase-stable femtosecond hard X-ray pulse pairs
Y Zhang, T Kroll, C Weninger, Y Michine, FD Fuller, D Zhu, R Alonso-Mori, ...
Proceedings of the National Academy of Sciences 119 (12), e2119616119, 2022
102022
Simulation of dc conductance of two‐dimensional heterogeneous system: application to carbon wires made by ion irradiation on polycrystalline diamond
NA Poklonski, AA Kocherzhenko, AI Benediktovitch, VV Mitsianok, ...
physica status solidi (b) 243 (6), 1212-1218, 2006
102006
Towards novel probes for valence charges via X-ray optical wave mixing
C Boemer, D Krebs, A Benediktovitch, E Rossi, S Huotari, N Rohringer
Faraday discussions 228, 451-469, 2021
92021
Characterization of SiGe thin films using a laboratory X-ray instrument
T Ulyanenkova, M Myronov, A Benediktovitch, A Mikhalychev, J Halpin, ...
Journal of Applied Crystallography 46 (4), 898-902, 2013
92013
Amplified spontaneous emission in the extreme ultraviolet by expanding xenon clusters
A Benediktovitch, L Mercadier, O Peyrusse, A Przystawik, T Laarmann, ...
Physical Review A 101 (6), 063412, 2020
82020
Lattice tilt, concentration, and relaxation degree of partly relaxed InGaAs/GaAs structures
A Benediktovitch, F Rinaldi, S Menzel, K Saito, T Ulyanenkova, ...
physica status solidi (a) 208 (11), 2539-2543, 2011
82011
Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer
A Benediktovitch, T Ulyanenkova, J Keckes, A Ulyanenkov
Journal of applied crystallography 47 (6), 1931-1938, 2014
72014
Parametric X-rays from a polycrystalline target
I Lobach, A Benediktovitch, I Feranchuk, A Lobko
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2015
62015
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