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Co-authors
- Young-Ho KoElectronics and Telecommunications Research Institute (ETRI)Verified email at etri.re.kr
- JE-HYUNG KIMUNISTVerified email at unist.ac.kr
- L. (Kobus) KuipersProfessor, Delft University of Technology, The NetherlandsVerified email at tudelft.nl
- Filippo AlpeggianiDesign engineer at ASMLVerified email at asml.com
- Sejeong KimUniversity of MelbourneVerified email at unimelb.edu.au
- Sang-Wan RyuChonnam National UniversityVerified email at chonnam.ac.kr
- Erik GarnettAMOLF Institute, Amsterdam, the NetherlandsVerified email at amolf.nl
- Beniamino SciaccaResearcher - CNRS, FRVerified email at cinam.univ-mrs.fr
- Elhadj DoghecheInsitute Electronic Microelectronic Nanotechnology IEMN CNRSVerified email at univ-valenciennes.fr
- JinDong SongKISTVerified email at kist.re.kr
- Arnaud StolzGroupe de Recherches sur l'Energétique des Milieux Ionisés (GREMI)Verified email at univ-orleans.fr
- Min-Ho Jang--Verified email at kaist.ac.kr
- Jonghwa ShinDepartment of Materials Science and Engineering, Korea Advanced Institute of Science and TechnologyVerified email at kaist.ac.kr
- Xiang ZHANGUniversity of Hong KongVerified email at hku.hk
- Le Si DangInstitut NéelVerified email at neel.cnrs.fr
- Y. M. KimInstitute for Research in Electronics and Applied Physics, University of MarylandVerified email at umd.edu
- Guoqing XinHuazhong University of Science and TechnologyVerified email at hust.edu.cn