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Co-authors
- Volker JungnickelFraunhofer Heinrich Hertz Institute (HHI) and Technische Universität Berlin (TUB)Verified email at hhi.fraunhofer.de
- Wen XuHuaweiVerified email at ieee.org
- Mate BobanHuawei Technologies, Munich Research CenterVerified email at cmu.edu
- Tommy SvenssonChalmers University of TechnologyVerified email at chalmers.se
- Apostolos KousaridasNokiaVerified email at nokia.com
- Moritz LossowFraunhofer Heinrich Hertz InstituteVerified email at hhi.fraunhofer.de
- wolfgang zirwasNokia NetworksVerified email at nokia.com
- Miguel Angel Gutierrez EstevezHuaweiVerified email at huawei.com
- Christian OberliAssociate Professor of Electrical Engineering, Pontificia Universidad Católica de ChileVerified email at uc.cl
- Thomas HausteinFraunhofer Heinrich Hertz Institute BerlinVerified email at hhi.fraunhofer.de
- Stephan JaeckelFraunhofer Heinrich Hertz Institute, Berlin, GermanyVerified email at hhi.fraunhofer.de
- A. LayaEricssonVerified email at ericsson.com
- Jesus Alonso-Zaratei2cat FoundationVerified email at i2cat.net
- David M. Gutierrez-EstevezChief Engineer, Samsung R&D Institute UKVerified email at samsung.com
- Toktam MahmoodiCentre for Telecommunications Research, Department of Engineering, King's College LondonVerified email at kcl.ac.uk
- Ricard VilaltaResearch Director, CTTC-CERCAVerified email at cttc.es
- Taimoor AbbasPhD, Lund University, SwedenVerified email at eit.lth.se
- Samer BazziSenior staff research specialist, NokiaVerified email at nokia.com
- Lars ThieleFraunhofer Heinrich Hertz InstituteVerified email at hhi.fraunhofer.de
- Fernando E. RosasLecturer at University of SussexVerified email at sussex.ac.uk