| International comparison of noise in areal surface topography measurements M Vanrusselt, H Haitjema, R Leach, P de Groot Surface Topography: Metrology and Properties 9 (2), 025015, 2021 | 16 | 2021 |
| Characterization of measurement and instrument noise in areal surface topography measurements by the Allan deviation M Vanrusselt, H Haitjema CIRP Annals 72 (1), 485-488, 2023 | 5 | 2023 |
| International comparison of flatness deviation in areal surface topography measurements M Vanrusselt, H Haitjema, R Leach, P de Groot CIRP Annals 71 (1), 453-456, 2022 | 3 | 2022 |
| Reduction of noise bias in 2.5 D surface measurements M Vanrusselt, H Haitjema Proceedings of euspen's 20th International Conference & Exhbition, 277-281, 2020 | 3 | 2020 |
| Characterization of hybrid laser-electrochemically machined cavities by areal surface roughness parameters KK Saxena, M Vanrusselt, J Qian, D Reynaerts, H Haitjema Proceedings of euspen’s 20th International Conference & Exhibition, European …, 2020 | 1 | 2020 |
Han HaitjemaKU LeuvenVerified email at kuleuven.be
