| Cathodoluminescence Studies of the Inhomogeneities in Sn-doped Ga2O3 Nanowires SI Maximenko, L Mazeina, YN Picard, JA Freitas Jr, VM Bermudez, ... Nano letters 9 (9), 3245-3251, 2009 | 94 | 2009 |
| Cathodoluminescence study of the properties of stacking faults in 4H-SiC homoepitaxial layers SI Maximenko, JA Freitas, PB Klein, A Shrivastava, TS Sudarshan Applied Physics Letters 94 (9), 2009 | 74 | 2009 |
| High-bandgap solar cells for underwater photovoltaic applications PP Jenkins, S Messenger, KM Trautz, SI Maximenko, D Goldstein, ... IEEE Journal of Photovoltaics 4 (1), 202-207, 2013 | 72 | 2013 |
| Growth of Sn-Doped β-Ga2O3 Nanowires and Ga2O3−SnO2 Heterostructures for Gas Sensing Applications L Mazeina, YN Picard, SI Maximenko, FK Perkins, ER Glaser, ME Twigg, ... Crystal growth & design 9 (10), 4471-4479, 2009 | 56 | 2009 |
| Bulk growth of single crystal silicon carbide TS Sudarshan, SI Maximenko Microelectronic engineering 83 (1), 155-159, 2006 | 54 | 2006 |
| Stacking fault nucleation sites in diffused 4H-SiC p‐i‐n diodes. SI Maximenko, TS Sudarshan Journal of applied physics 97 (7), 2005 | 53 | 2005 |
| Optimal Semiconductors for 3 H and 63 Ni Betavoltaics S Maximenko, J Moore, C E Affouda, P Jenkins Scientific Reports 9 (1), 10892, 2019 | 42 | 2019 |
| Effect of threading screw and edge dislocations on transport properties of 4H–SiC homoepitaxial layers SI Maximenko, JA Freitas, RL Myers-Ward, KK Lew, BL VanMil, CR Eddy, ... Journal of applied physics 108 (1), 2010 | 38 | 2010 |
| Differences in emission spectra of Si-and C-core partial dislocations KX Liu, RE Stahlbush, SI Maximenko, JD Caldwell Applied physics letters 90 (15), 2007 | 38 | 2007 |
| Investigation of the electrical activity of partial dislocations in SiC pin diodes SI Maximenko, P Pirouz, TS Sudarshan Applied Physics Letters 87 (3), 2005 | 36 | 2005 |
| Observation of dislocations in diffused 4H–SiC pin diodes by electron-beam induced current S Maximenko, S Soloviev, D Cherednichenko, T Sudarshan Journal of applied physics 97 (1), 2005 | 33 | 2005 |
| Electron-beam-induced current observed for dislocations in diffused diodes S Maximenko, S Soloviev, D Cherednichenko, T Sudarshan Applied physics letters 84 (9), 1576-1578, 2004 | 32 | 2004 |
| Open core dislocations and surface energy of SiC SI Maximenko, P Pirouz, TS Sudarshan Materials science forum 527, 439-442, 2006 | 23 | 2006 |
| Quaternary Sputtered Cu(In,Ga)Se2 Absorbers for Photovoltaics: A Review JA Frantz, JD Myers, RY Bekele, VQ Nguyen, BM Sadowski, ... IEEE Journal of Photovoltaics 6 (4), 1036-1050, 2016 | 22 | 2016 |
| Application of CL/EBIC-SEM techniques for characterization of radiation effects in multijunction solar cells SI Maximenko, SR Messenger, CD Cress, JA Freitas, RJ Walters IEEE Transactions on Nuclear Science 57 (6), 3095-3100, 2010 | 21 | 2010 |
| Plan view and cross-sectional view EBIC measurements: Effect of e-beam injection conditions on extracted minority carrier transport properties O Marcelot, SI Maximenko, P Magnan IEEE Transactions on Electron Devices 61 (7), 2437-2442, 2014 | 17 | 2014 |
| Modeling of radiation induced defects in space solar cells RJ Walters, S Messenger, JH Warner, CD Cress, M Gonzalez, ... Physics and Simulation of Optoelectronic Devices XIX 7933, 129-149, 2011 | 17 | 2011 |
| Surface diffusion measurements of In on InGaAs enabled by droplet epitaxy MA Stevens, S Tomasulo, S Maximenko, TE Vandervelde, MK Yakes Journal of Applied Physics 121 (19), 2017 | 16 | 2017 |
| Characterization of high fluence irradiations on advanced triple junction solar cells SI Maximenko, SR Messenger, R Hoheisel, D Scheiman, M Gonzalez, ... 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 2797-2800, 2013 | 13 | 2013 |
| Recent developments in type-II superlattice-based infrared detectors EH Aifer, SI Maximenko, MK Yakes, C Yi, CL Canedy, I Vurgaftman, ... Infrared Technology and Applications XXXVI 7660, 540-551, 2010 | 12 | 2010 |
Phillip P. JenkinsNaval Research LabVerified email at nrl.navy.mil
