| A Comprehensive Study on Deep Learning Bug Characteristics MJ Islam, G Nguyen, R Pan, H Rajan ESEC/FSE'19: The ACM Joint European Software Engineering Conference and …, 2019 | 297 | 2019 |
| Repairing deep neural networks: Fix patterns and challenges MJ Islam, R Pan, G Nguyen, H Rajan Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020 | 123 | 2020 |
| Lost in translation: A study of bugs introduced by large language models while translating code R Pan, AR Ibrahimzada, R Krishna, D Sankar, LP Wassi, M Merler, ... Proceedings of the IEEE/ACM 46th International Conference on Software …, 2024 | 70 | 2024 |
| What do developers ask about ml libraries? a large-scale study using stack overflow MJ Islam, HA Nguyen, R Pan, H Rajan arXiv preprint arXiv:1906.11940, 2019 | 39 | 2019 |
| On Decomposing a Deep Neural Network into Modules R Pan, H Rajan Proceedings of the 2020 28th ACM Joint Meeting on European Software …, 2020 | 38 | 2020 |
| Can Program Synthesis be Used to Learn Merge Conflict Resolutions? An Empirical Analysis R Pan, V Le, N Nagappan, S Gulwani, S Lahiri, M Kaufman 2021 IEEE/ACM 43nd International Conference on Software Engineering (ICSE), 2021 | 36 | 2021 |
| Decomposing Convolutional Neural Networks into Reusable and Replaceable Modules R Pan, H Rajan 2022 IEEE/ACM 44th International Conference on Software Engineering (ICSE), 2022 | 27 | 2022 |
| Manas: Mining Software Repositories to Assist AutoML G Nguyen, J Islam, R Pan, H Rajan 2022 IEEE/ACM 44th International Conference on Software Engineering (ICSE), 2022 | 18 | 2022 |
| Repairing deep neural networks: Fix patterns and challenges. In 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE) MJ Islam, R Pan, G Nguyen, H Rajan IEEE, 2020 | 16 | 2020 |
| Identifying classes susceptible to adversarial attacks R Pan, MJ Islam, S Ahmed, H Rajan arXiv preprint arXiv:1905.13284, 2019 | 12 | 2019 |
| Decomposing a Recurrent Neural Network into Modules for Enabling Reusability and Replacement SM Imtiaz, F Batole, A Singh, R Pan, BD Cruz, H Rajan 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE), 2023 | 7 | 2023 |
| What do developers ask about ML libraries MJ Islam, HA Nguyen, R Pan, H Rajan A Large-scale Study Using Stack Overflow. arXiv, 1906 | 6 | 1906 |
| Does fixing bug increase robustness in deep learning? R Pan Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020 | 4 | 2020 |
| Static deep neural network analysis for robustness R Pan Proceedings of the 2019 27th ACM Joint meeting on european software …, 2019 | 4 | 2019 |
| What is prompt-tuning? K Martineau, P Hess, AI Generative | 3 | 2023 |
| Decomposing a Recurrent Neural Network into Modules for Enabling Reusability and Replacement. In 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE … SM Imtiaz, F Batole, A Singh, R Pan, BD Cruz, H Rajan | 3 | 2023 |
| Towards Supporting Universal Static Analysis using WALA R Krishna, R Pavuluri, S Sinha, D Sankar, J Dolby, R Pan ACM SIGPLAN Conference on Programming Language Design and Implementation, 2023 | 2 | 2023 |
| An Empirical Study on the Bugs Found while Reusing Pre-trained Natural Language Processing Models R Pan, S Biswas, M Chakraborty, BD Cruz, H Rajan arXiv preprint arXiv:2212.00105, 2022 | 2 | 2022 |
| A benchmark for bugs and fix patterns for deep neural networks MJ Islam, R Pan, G Nguyen, H Rajan | 2 | 2020 |
| A comprehensive study on deep learning bug characteristics, 2019 MJ Islam, G Nguyen, R Pan, H Rajan Google Scholar Google Scholar Digital Library Digital Library, 0 | 2 | |
Hridesh RajanDean, Tulane University School of Science and EngineeringVerified email at acm.org
