| Hartmann wave-front measurement at 13.4 nm with λEUV/120 accuracy P Mercère, P Zeitoun, M Idir, S Le Pape, D Douillet, X Levecq, G Dovillaire, ... Optics letters 28 (17), 1534-1536, 2003 | 126 | 2003 |
| X-ray active mirror coupled with a Hartmann wavefront sensor M Idir, P Mercere, MH Modi, G Dovillaire, X Levecq, S Bucourt, L Escolano, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 69 | 2010 |
| Dynamic study of a Varioptic variable focal lens C Gabay, B Berge, G Dovillaire, S Bucourt Current Developments in Lens Design and Optical Engineering III 4767, 159-165, 2002 | 64 | 2002 |
| Optimization of the wave front of high order harmonics J Gautier, P Zeitoun, C Hauri, AS Morlens, G Rey, C Valentin, ... The European Physical Journal D 48, 459-463, 2008 | 50 | 2008 |
| Automatic alignment of a Kirkpatrick-Baez active optic by use of a soft-x-ray Hartmann wavefront sensor P Mercère, M Idir, T Moreno, G Cauchon, G Dovillaire, X Levecq, L Couvet, ... Optics letters 31 (2), 199-201, 2006 | 40 | 2006 |
| High-order harmonic wave fronts generated with controlled astigmatic infrared laser C Valentin, J Gautier, JP Goddet, C Hauri, T Marchenko, E Papalazarou, ... JOSA B 25 (7), B161-B166, 2008 | 29 | 2008 |
| Device for measuring aberrations in an eye-type system SH Bucourt, JFX Levecq US Patent 7,255,442, 2007 | 29 | 2007 |
| Method and device for wavefront optical analysis S Bucourt, X Levecq US Patent 6,653,613, 2003 | 19 | 2003 |
| Recent developments in X-UV optics and X-UV diagnostics P Zeitoun, P Balcou, S Bucourt, F Delmotte, G Dovillaire, D Douillet, ... Applied Physics B 78, 983-988, 2004 | 18 | 2004 |
| X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing P Mercere, S Bucourt, G Cauchon, D Douillet, G Dovillaire, KA Goldberg, ... Advances in Metrology for X-Ray and EUV Optics 5921, 63-72, 2005 | 17 | 2005 |
| Method and device for analysing a highly dynamic wavefront XJF Levecq, SH Bucourt US Patent 6,750,957, 2004 | 17 | 2004 |
| Lensless microscopy platform for single cell and tissue visualization R Corman, W Boutu, A Campalans, P Radicella, J Duarte, M Kholodtsova, ... Biomedical optics express 11 (5), 2806-2817, 2020 | 14 | 2020 |
| Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications P Mercère, M Idir, G Dovillaire, X Levecq, S Bucourt, L Escolano, ... Adaptive X-Ray Optics 7803, 11-21, 2010 | 14 | 2010 |
| A Shack–Hartmann measuring head for the two-dimensional characterization of X-ray mirrors J Floriot, X Levecq, S Bucourt, M Thomasset, F Polack, M Idir, P Mercere, ... Journal of Synchrotron Radiation 15 (2), 134-139, 2008 | 11 | 2008 |
| Determination of flatness on patterned wafer surfaces using wavefront sensing methods A Nutsch, L Pfitzner, T Grandin, X Levecq, S Bucourt Ninth International Symposium on Laser Metrology 7155, 327-338, 2008 | 9 | 2008 |
| Wavefront Closed‐Loop Correction for X‐Ray Microfocusing Active Optics P Mercère, M Idir, T Moreno, G Cauchon, G Dovillaire, X Levecq, ... AIP Conference Proceedings 879 (1), 722-725, 2007 | 9 | 2007 |
| X Ray wavefront Hartmann sensor P Mercère, M Idir, P Zeitoun, X Levecq, G Dovillaire, S Bucourt, D Douillet, ... AIP Conference Proceedings 705 (1), 819-822, 2004 | 8 | 2004 |
| In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation M Thomasset, T Moreno, B Capitanio, M Idir, S Bucourt Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010 | 7 | 2010 |
| Wave front sensor for highly accurate characterization of flatness on wafer surfaces A Nutsch, S Bucourt, T Grandin, I Lazareva, L Pfitzner AIP Conference Proceedings 1173 (1), 188-192, 2009 | 7 | 2009 |
| Surface metrology with a stitching Shack-Hartmann profilometric head J Floriot, X Levecq, S Bucourt, M Thomasset, F Polack, M Idir, P Mercere, ... Optical Measurement Systems for Industrial Inspection V 6616, 653-664, 2007 | 6 | 2007 |
