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Wendi Guo
Wendi Guo
Aalborg University / Chalmers University of Technology
Verified email at energy.aau.dk - Homepage
Title
Cited by
Cited by
Year
Review of “grey box” lifetime modeling for lithium-ion battery: Combining physics and data-driven methods
W Guo, Z Sun, SB Vilsen, J Meng, DI Stroe
Journal of Energy Storage 56, 105992, 2022
402022
Life prediction methodology of system-in-package based on physics of failure
G Fu, Y Su, W Guo, B Wan, Z Zhang, Y Wang
Microelectronics Reliability 88, 173-178, 2018
122018
Storage PoF model of electromagnetic relays based on electrical contact theory
W Guo, G Fu, B Wan, M Jiang, Y Li
Microelectronics Reliability 100, 113381, 2019
62019
Identification of mechanism consistency for LFP/C batteries during accelerated aging tests based on statistical distributions
W Guo, Z Sun, SB Vilsen, F Blaabjerg, DI Stroe
e-Prime-Advances in Electrical Engineering, Electronics and Energy 4, 100142, 2023
52023
Reconstruction of pressureless sintered micron silver joints and simulation analysis of elasticity degradation in deep space environment
W Guo, G Fu, B Wan, M Zhu
Applied Sciences 10 (18), 6368, 2020
32020
Thermal Characteristics of Liquid Metal Interconnects for Power Semiconductors
Z Sun, AB Jørgensen, N Baker, S Beczkowski, W Guo, S Munk-Nielsen, ...
2023 IEEE Applied Power Electronics Conference and Exposition (APEC), 1135-1140, 2023
22023
Reliability Assessment Methodology of Power Devices Based on Physics of Failure and Multivariate Copulas
W Guo, G Fu, B Wan, Y Su
2019 Prognostics and System Health Management Conference (PHM-Qingdao), 1-6, 2019
22019
A digital twin to quantitatively understand aging mechanisms coupled effects of NMC battery using dynamic aging profiles
W Guo, Y Li, Z Sun, SB Vilsen, DI Stroe
Energy Storage Materials 63, 102965, 2023
12023
Solid electrolyte interface layer growth-crack formation coupled model for Lithium-ion battery capacity fade prediction
W Guo, Y Li, Z Sun, SB Vilsen, DI Stroe
2023 25th European Conference on Power Electronics and Applications (EPE'23 …, 2023
12023
Single event upset reliability assessment for RAM based on maximum entropy principle and bootstrap
Z Zhang, G Fu, W Guo, Y Su, B Wang
2018 Prognostics and System Health Management Conference (PHM-Chongqing …, 2018
12018
A Computational Multiscale Modeling Method for Nanosilver-Sintered Joints with Stochastically Distributed Voids
Z Sun, W Guo, AB Jørgensen
Journal of Electronic Materials, 1-18, 2024
2024
Power semiconductors for an energy-wise society
M Rahimo, I Nistor, P Lanctot, S Idaka, H Kondo, G Majumdar, A Miyoshi, ...
2023
Features extraction for battery SOH estimation from battery pulsed charging operation
S Jin, X Yu, X Sui, W Guo, M Berecibar, DI Stroe
2023 25th European Conference on Power Electronics and Applications (EPE'23 …, 2023
2023
How to identify mechanism consistency for LFP/C batteries during accelerated calendar and cycling aging using the lognormal distribution
W Guo, Z Sun, Y Li, SB Vilsen, DI Stroe
2023 IEEE Applied Power Electronics Conference and Exposition (APEC), 1816-1821, 2023
2023
e-Prime-Advances in Electrical Engineering, Electronics and Energy
W Guo, Z Sun, SB Vilsen, F Blaabjerg, DI Stroe
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