Adedapo Oni
Adedapo Oni
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Spin-driven ordering of Cr in the equiatomic high entropy alloy NiFeCrCo
C Niu, AJ Zaddach, AA Oni, X Sang, JW Hurt III, JM LeBeau, CC Koch, ...
Applied Physics Letters 106 (16), 161906, 2015
300mm heterogeneous 3D integration of record performance layer transfer germanium PMOS with silicon NMOS for low power high performance logic applications
W Rachmady, A Agrawal, SH Sung, G Dewey, S Chouksey, B Chu-Kung, ...
2019 IEEE International Electron Devices Meeting (IEDM), 29.7. 1-29.7. 4, 2019
Atom column indexing: atomic resolution image analysis through a matrix representation
X Sang, AA Oni, JM LeBeau
Microscopy and Microanalysis 20 (6), 1764-1771, 2014
Accurate nanoscale crystallography in real-space using scanning transmission electron microscopy
JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, ...
Microscopy and Microanalysis 21 (4), 946-952, 2015
Structure and magnetic properties of a multi-principal element Ni–Fe–Cr–Co–Zn–Mn alloy
AJ Zaddach, C Niu, AA Oni, M Fan, JM LeBeau, DL Irving, CC Koch
Intermetallics 68, 107-112, 2016
The role of terminal oxide structure and properties in nanothermite reactions
EJ Mily, A Oni, JM LeBeau, Y Liu, HJ Brown-Shaklee, JF Ihlefeld, ...
Thin Solid Films 562, 405-410, 2014
Effect of B and Cr on elastic strength and crystal structure of Ni3Al alloys under high pressure
SV Raju, AA Oni, BK Godwal, J Yan, V Drozd, S Srinivasan, JM LeBeau, ...
Journal of Alloys and Compounds 619, 616-620, 2015
Large area strain analysis using scanning transmission electron microscopy across multiple images
AA Oni, X Sang, SV Raju, S Dumpala, S Broderick, A Kumar, S Sinnott, ...
Applied Physics Letters 106 (1), 011601, 2015
3-D self-aligned stacked NMOS-on-PMOS nanoribbon transistors for continued Moore’s law scaling
CY Huang, G Dewey, E Mannebach, A Phan, P Morrow, W Rachmady, ...
2020 IEEE International Electron Devices Meeting (IEDM), 20.6. 1-20.6. 4, 2020
Atom site preference and γ′/γ mismatch strain in NiAlCoTi superalloys
AA Oni, SR Broderick, K Rajan, JM LeBeau
Intermetallics 73, 72-78, 2016
Combined experimental and computational methods reveal the evolution of buried interfaces during synthesis of ferroelectric thin films
JL Jones, JM LeBeau, J Nikkel, AA Oni, JH Dycus, C Cozzan, FY Lin, ...
Advanced Materials Interfaces 2 (10), 1500181, 2015
Gate-All-Around Strained Si0.4Ge0.6 Nanosheet PMOS on Strain Relaxed Buffer for High Performance Low Power Logic Application
A Agrawal, S Chouksey, W Rachmady, S Vishwanath, S Ghose, M Mehta, ...
2020 IEEE International Electron Devices Meeting (IEDM), 2.2. 1-2.2. 4, 2020
Advancing Monolayer 2-D nMOS and pMOS Transistor Integration From Growth to Van Der Waals Interface Engineering for Ultimate CMOS Scaling
C Dorow, K O’Brien, CH Naylor, S Lee, A Penumatcha, A Hsiao, T Tronic, ...
IEEE Transactions on Electron Devices 68 (12), 6592-6598, 2021
Advances in Research on 300mm gallium nitride-on-Si (111) NMOS transistor and silicon CMOS integration
HW Then, M Radosavljevic, N Desai, R Ehlert, V Hadagali, K Jun, ...
2020 IEEE International Electron Devices Meeting (IEDM), 27.3. 1-27.3. 4, 2020
Airbrushed nickel nanoparticles for large-area growth of vertically aligned carbon nanofibers on metal (Al, Cu, Ti) surfaces
MF Sarac, BD Anderson, RC Pearce, JG Railsback, AA Oni, RM White, ...
ACS Applied Materials & Interfaces 5 (18), 8955-8960, 2013
Advancing 2D Monolayer CMOS through Contact, Channel and Interface Engineering
KP O'Brien, CJ Dorow, A Penumatcha, K Maxey, S Lee, CH Naylor, ...
2021 IEEE International Electron Devices Meeting (IEDM), 7.1. 1-7.1. 4, 2021
JWH III, JM LeBeau, CC Koch, DL Irving, Spin-driven ordering of Cr in the equiatomic high entropy alloy NiFeCrCo
C Niu, AJ Zaddach, AA Oni, X Sang
Appl. Phys. Lett 106, 161906, 2015
Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)
S Dumpala, AA Oni, S Padalkar, SR Broderick, JM LeBeau, K Rajan
Microscopy and Microanalysis 20 (S3), 996-997, 2014
Phase coexistence in Ti6Sn5 intermetallics
AA Oni, D Hook, JP Maria, JM LeBeau
Intermetallics 51, 48-52, 2014
Advanced Scaling of Enhancement Mode High-K Gallium Nitride-on-300mm-Si (111) Transistor and 3D Layer Transfer GaN-Silicon Finfet CMOS Integration
HW Then, M Radosavljevic, P Koirala, N Thomas, N Nair, I Ban, ...
2021 IEEE International Electron Devices Meeting (IEDM), 11.1. 1-11.1. 4, 2021
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