| Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory A Hirabayashi, H Ogawa, K Kitagawa Applied Optics 41 (23), 4876-4883, 2002 | 110 | 2002 |
| Thin-film thickness profile measurement by three-wavelength interference color analysis K Kitagawa Applied optics 52 (10), 1998-2007, 2013 | 84 | 2013 |
| Single-shot surface profiling by local model fitting M Sugiyama, H Ogawa, K Kitagawa, K Suzuki Applied Optics 45 (31), 7999-8005, 2006 | 57 | 2006 |
| Fast surface profiling by multi-wavelength single-shot interferometry K Kitagawa International Journal of Optomechatronics 4 (2), 136-156, 2010 | 46 | 2010 |
| Single-shot surface profiling by multiwavelength interferometry without carrier fringe introduction K Kitagawa Journal of Electronic Imaging 21 (2), 021107-021107, 2012 | 38 | 2012 |
| Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry K Kitagawa Optics Letters 39 (14), 4172-4175, 2014 | 28 | 2014 |
| Development of new hybrid transmission for 2009 Prius A Takasaki, T Mizutani, K Kitagawa, T Yamahana, K Odaka, T Kuzuya, ... Proc. EVS24 Int. Battery, Hybrid Fuel Cell Elect. Veh. Symp., 2009 | 25 | 2009 |
| Fast surface profiler by white-light interferometry using a new algorithm, the SEST algorithm A Hirabayashi, H Ogawa, K Kitagawa Optical Manufacturing and Testing IV 4451, 356-367, 2001 | 22 | 2001 |
| Multiwavelength single-shot interferometry without carrier fringe introduction K Kitagawa Tenth International Conference on Quality Control by Artificial Vision 8000 …, 2011 | 18 | 2011 |
| Thin film thickness profile measurement using an interferometric surface profiler K Kitagawa Optomechatronic Sensors and Instrumentation III 6716, 52-63, 2007 | 17 | 2007 |
| Two-wavelength single-shot interferometry K Kitagawa, M Sugiyama, T Matsuzaka, H Ogawa, K Suzuki SICE Annual Conference 2007, 724-728, 2007 | 16 | 2007 |
| 3D Profiling of a transparent film using white-light interferometry K Kitagawa SICE 2004 Annual Conference 1, 585-590, 2004 | 14 | 2004 |
| Burning rate anomaly of composite propellant grains H Hasegawa, M Fukunaga, K Kitagawa, T Shimada Combustion, Explosion, and Shock Waves 49, 583-592, 2013 | 12 | 2013 |
| Surface profile measuring method and apparatus H Ogawa, A Hirabayashi, K Kitagawa US Patent 6,501,553, 2002 | 12 | 2002 |
| Method for measuring surface profile, and apparatus using the same M Sugiyama, H Ogawa, K Kitagawa, K Suzuki US Patent 7,852,489, 2010 | 9 | 2010 |
| Simultaneous measurement of film surface topography and thickness variation using white-light interferometry K Kitagawa Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems 6375 …, 2006 | 9 | 2006 |
| Fast surface profiling by white-light interferometry using a sampling theorem for band-pass signals A Hirabayashi, H Ogawa, T Mizutani, K Nagai, K Kitagawa Transactions of the Society of Instrument and Control Engineers 36 (1), 16-25, 2000 | 9 | 2000 |
| Multi-wavelength single-shot interferometry K Kitagawa 2009 International Symposium on Optomechatronic Technologies, 34-39, 2009 | 8 | 2009 |
| Recent trends in white-light interferometry K Kitagawa Two-and Three-Dimensional Methods for Inspection and Metrology IV 6382, 638201, 2006 | 8 | 2006 |
| Registration of infrared transmission images using squared-loss mutual information T Sakai, M Sugiyama, K Kitagawa, K Suzuki Precision Engineering 39, 187-193, 2015 | 7 | 2015 |
