| Lithography for robust and editable atomic-scale silicon devices and memories R Achal, M Rashidi, J Croshaw, D Churchill, M Taucer, T Huff, M Cloutier, ... Nature communications 9 (1), 2778, 2018 | 61 | 2018 |
| Electrostatic landscape of a hydrogen-terminated silicon surface probed by a moveable quantum dot TR Huff, T Dienel, M Rashidi, R Achal, L Livadaru, J Croshaw, RA Wolkow ACS nano 13 (9), 10566-10575, 2019 | 26 | 2019 |
| Deep learning-guided surface characterization for autonomous hydrogen lithography M Rashidi, J Croshaw, K Mastel, M Tamura, H Hosseinzadeh, RA Wolkow Machine Learning: Science and Technology 1 (2), 025001, 2020 | 20 | 2020 |
| Resolving and tuning carrier capture rates at a single silicon atom gap state M Rashidi, E Lloyd, TR Huff, R Achal, M Taucer, JJ Croshaw, RA Wolkow ACS nano 11 (11), 11732-11738, 2017 | 17 | 2017 |
| Atomic defect classification of the H–Si (100) surface through multi-mode scanning probe microscopy J Croshaw, T Dienel, T Huff, R Wolkow Beilstein Journal of Nanotechnology 11 (1), 1346-1360, 2020 | 10 | 2020 |
| Detecting and Directing Single Molecule Binding Events on H-Si (100) with Application to Ultradense Data Storage R Achal, M Rashidi, J Croshaw, TR Huff, RA Wolkow ACS nano 14 (3), 2947-2955, 2019 | 7 | 2019 |
| Ionic charge distributions in silicon atomic surface wires J Croshaw, T Huff, M Rashidi, J Wood, E Lloyd, J Pitters, RA Wolkow Nanoscale 13 (5), 3237-3245, 2021 | 3 | 2021 |
| Ionic Charge Distributions in Silicon Atomic Wires J Croshaw, T Huff, M Rashidi, J Wood, E Lloyd, J Pitters, R Wolkow arXiv preprint arXiv:2011.08056, 2020 | | 2020 |
