h5 指数是指在过去整整 5 年中所发表文章的 h 指数。h 指在 2018-2022 年间发表的 h 篇文章每篇至少都被引用过 h 次的最大值。隐藏
出版物的 h5 中位数，是指出版物的 h5 指数所涵盖的所有文章获得的引用次数的中位值。隐藏
| 出版物 | h5 指数 | h5 中位数 | |
|---|---|---|---|
| 1. | IEEE Electron Device Letters | 70 | 91 |
| 2. | IEEE Transactions on Electron Devices | 61 | 78 |
| 3. | IEEE International Electron Devices Meeting, IEDM | 51 | 68 |
| 4. | Microwave and Optical Technology Letters | 40 | 53 |
| 5. | Microelectronic Engineering | 39 | 51 |
| 6. | Journal of Semiconductors | 37 | 56 |
| 7. | Electronics Letters | 37 | 54 |
| 8. | IEEE Symposium on VLSI Technology | 37 | 52 |
| 9. | IEEE Journal of the Electron Devices Society | 37 | 47 |
| 10. | IEEE Transactions on Components, Packaging and Manufacturing Technology | 37 | 44 |
| 11. | Microelectronics Reliability | 35 | 42 |
| 12. | IEEE Electronic Components and Technology Conference (ECTC) | 30 | 39 |
| 13. | Solid-State Electronics | 30 | 39 |
| 14. | Microelectronics Journal | 30 | 37 |
| 15. | Analog Integrated Circuits and Signal Processing | 27 | 34 |
| 16. | IEEE Solid-State Circuits Letters | 27 | 33 |
| 17. | IEEE/MTT-S International Microwave Symposium | 26 | 38 |
| 18. | Journal of Electronic Packaging | 26 | 30 |
| 19. | IEEE International Reliability Physics Symposium (IRPS) | 23 | 32 |
| 20. | IEEE Transactions on Device and Materials Reliability | 23 | 31 |
计算机程序会自动估算并确定日期和引用次数。